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Microfocus X-ray Inspection Systems

Microfocus X-ray Inspection System
Xslicer SMX-1010/1020 Chromatography Systems

The Xslicer SMX-1010/1020 is a vertical emission X-ray system equipped
with 90 kV microfocus X-ray generator and a high-resolution flat panel
detector. Image quality has been significantly improved over the
previous model (SMX-1000 Plus), and Shimadzu’s renowned operability
has advanced even further. In addition to operability improvements, the
stage movement speed and detector acquisition speed have also
increased, significantly shortening inspection times. The inspection Mass Spectrometry Systems
process is now more efficient. The workflow has also been simplified for
the CT unit (optionally available), and operability has been improved.
With the Xslicer SMX-1010/1020, everything from X-ray fluoroscopic
inspections of surface mounted circuit boards, sensors, and harnesses to
3D defect analysis using CT can be accomplished with a single unit.
Target object Electronic parts, mounting boards, resin, etc.
W: 350 × D: 450 × H: 100 mm, max.
Maximum sample size
5 kg max. Life Science Lab Systems
SMX-1010: 1.9 mm (vertical) × 2.2 mm (horizontal) to 38 mm
Fluoroscopy FOV (vertical) × 43 mm (horizontal)
(on carbon plate) SMX-1020: 2.2 mm (vertical) × 3.8 mm (horizontal) to 42 mm
(vertical) × 76 mm (horizontal)
Brochure No. C251-E039
New HDR Processing Function
Shimadzu’s unique, proprietary image processing technique/algorithm
allows fluoroscopic images with a higher dynamic range. Regions that
are both easy and difficult to penetrate can be observed at the same Spectroscopy Systems
time, which shortens inspection times.
Without HDR Processing With HDR Processing

Microfocus X-ray Inspection System Microfocus X-ray CT System
Xslicer SMX-6010 inspeXio SMX-225CT FPD HR Plus Systems X-ray and Surface Analysis

Xslicer SMX-6010 is a planer X-ray inspection system, featuring a This is a high-performance microfocus X-ray CT system equipped with a Measurement Systems Environmental
micro-focus X-ray generator and a 3 megapixel flat panel detector. It Shimadzu microfocus X-ray generator and high-sensitivity X-ray
delivers high-accuracy images with a wide dynamic range that enable detector. Using the intuitive user interface, anyone can easily observe
detailed observations of internal structures and defects. In addition, the the 3D structure of the interior of samples. With its wide CT stage and Systems Non-Destructive Inspection Material Testing and
system switches smoothly between fluoroscopy and Computed new detector, larger samples can be inspected. A large high-resolution
Tomography (CT), enabling a variety of observations matched to the flat panel detector mounted, higher resolution and higher contrast CT
shape of the sample. This supports the inspection of various samples images can be achieved. It is suitable for observation of the internal
ranging from electronic parts with improved miniaturization to mounted structure of a wide range of samples such as aluminum die castings,
boards with advances in high-density multilayer design. electronic parts, and GFRP/CFRP composite materials.
Target object Electronic parts, mounting boards, etc. Target object Aluminum die castings, electronic circuit boards, electronic parts,
W: 470 × D: 420 × H: 100 mm, max. composite materials, etc.
Maximum sample size
5 kg max. Maximum sample size 400 mm dia. × H: 300 mm max. Measurement Systems Physical Properties
Fluoroscopic field of 0.75 (vertical) × 1.3 mm (horizontal) to 21 (vertical) × 38 mm 12 kg max.
view size (horizontal) X-ray detector 16-inch flat panel detector
3 to 30 mm (given 45° laminographic angle) Field of view 400 mm dia. max.
CT field of view size 3 to 14 mm (given 60° laminographic angle) Brochure No. C251-E029
Brochure No. C251-E040
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