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Surface Observation Instruments

Scanning Probe Microscope/Atomic Force Microscope
SPM-Nanoa Chromatography Systems

Leading you into the nano world.

The SPM-Nanoa is a middle-range SPM that adopts a low-noise, high-
sensitivity detection optical system equivalent to the high-end
SPM-8100FM, further advancing automation of operations and high
throughput. That means you can observe what you want to observe in Mass Spectrometry Systems
more detail, more easily, and more quickly. Consequently, SPM-Nanoa Visualization of Nano-scale Elastic Modulus and Adsorption
microscopes provide powerful assistance for everything from observing The elastic modulus can be evaluated quantitatively by applying a
the shape of micro areas to measuring their physical properties. theoretical model for calculating elastic modulus to the force curve
Automatic Observation obtained by measuring the micro-forces acting between the probe and
Adjusts laser beam, adjusts parameter settings during observation sample. The force distribution can also be visualized in the vertical
and performs image processing automatically direction for nano-scale three-dimensional mechanical analysis.
Extensive Functionality ■ Mapping the Physical Properties of Polymer Films
Capture sharp images with optical microscopy to SPM microscopy Life Science Lab Systems
modes
Saves Time
Various support functionality achieves fast observation
Standard: contact, dynamic, phase, lateral force (LFM),
force modulation
Observation mode
Optional: lateral force (MFM), surface potential (KPFM), current,
piezoelectric force (PFM), STM Surface Shape Elastic Modulus Adhesion
Resolution Horizontal: 0.2 nm, Vertical: 0.01 nm
Displacement detection system: Light source, optical lever, detector Mapping polymer film surface properties clearly showed how elastic Spectroscopy Systems
Light source: Laser diode (ON/OFF), Irradiates a cantilever modulus and adhesive forces were distributed in patches several tens of
SPM head continuously even while replacing samples
Detector: Photodetector nanometers in size.
Brochure No. C147-E018 (Sample source: MORESCO Corporation)

High-Resolution Scanning Probe Microscope Scanning Probe Microscope
SPM-8100FM SPM-9700HT Systems X-ray and Surface Analysis

The HR-SPM is a next-generation scanning probe microscope that This microscope can observe the three-dimensional image or local Measurement Systems Environmental
employs a frequency detection method. Existing SPMs (scanning probe properties of samples at high magnifications. It enables high-resolution
microscopes) and AFMs (atomic force microscopes) generally employ an observation, and can measure a variety of samples in air and in liquids.
AM (amplitude modulation) method. In principle however, the FM Due to the newly developed high response speed HT scanner and the Systems Non-Destructive Inspection Material Testing and
(frequency modulation) method is a high-sensitivity measurement optimized control system design and software, it is now possible to
method, which enables imaging at even higher levels of resolution. acquire image data at more than five times the speed of Shimadzu's
Not only does it enable ultra-high-resolution observation of atmospheric previous models.
or liquid-based targets, but now, for the first time, observation of This supports the improvement of total throughput via significant
hydration/solvation of the solid–liquid interface is made possible. reductions in measurement time. The system is ideal for measurements
Observation mode contact, dynamic (AM method and FM method), lateral force (LFM) involving a large number of samples or for routine observations.
Resolution Horizontal: 0.2 nm, Vertical: 0.01 nm Observation Standard: Contact, Dynamic, Phase, Lateral Force (LFM), Force Modulation
Displacement detection system: Light source, optical lever, detector modes Optional: Magnetic Force (MFM), Current, Surface Potential (KFM) Measurement Systems Physical Properties
Light source: laser diode (ON/OFF)
SPM head Resolution X, Y: 0.2 nm, Z: 0.01 nm
Irradiates a cantilever continuously even while replacing samples Displacement detection system: Light source, optical lever, detector
Detector: Photodetector Light source: Laser diode (ON/OFF)
Brochure No. C147-E016 AFM head Irradiates cantilever continuously, even while replacing samples.
Detector: Photodetector
Brochure No. C147-E017
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