Page 40 - 2023 Shimadzu Analytical and Measuring Instruments

X-ray Fluorescence Spectrometers

Energy Dispersive X-ray Fluorescence Spectrometer
EDX-7200

The EDX-7200 is a flagship model of the EDX series in pursuit of high
sensitivity, high speed and high precision. This model supports new
regulations and directives for consumer and environmental compliance,
such as RoHS/ELV, REACH, and TSCA with full exclusive screening
analysis kits. The EDX-7200 is equipped with a high-resolution SDD
detector to achieve a higher count rate and detection efficiency.

High Speed High Sensitivity
— Throughput Increased by Up to a Factor of 30 — — Improves Lower Detection Limit by Up to 6 Times —
Equipped with a high-speed circuit that increase the count rate by up to In metals analysis, the lower detection limit of trace elements in main
30 times compared to the former model (EDX-720). Improved components has been improved.
algorithms and improved performance also help to reduce Guide of the Lower Detection Limit (300 sec) for Lead in Metals [ppm]
measurement times.
EDX-7200 EDX-7000 EDX-720
[Counts] [Counts]
4000 Copper alloy 9.9 17.1 35.5
Lead (Pb) Chromium (Cr)
Solder 3.9 8.4 24.8
3000
Aluminum alloy 0.7 1.1 3.3
Count rate
Count rate 2000 30 times Note: The detection limit is an example and not a guaranteed value.
EDX-7200 30 times
EDX-7200 Elements to be
EDX-7000 1000 EDX-7000 determined 11Na to 92U
EDX-720 Sample chamber 300 (W) × 275 (D) × approx. 100 (H) mm max.
EDX-720
0 0 dimensions (Assuming no rounded corners)
11.4 12.4 13.4 [keV] 4.5 5.0 5.5 6.0 [keV] Primary filters 5 types (6 including the open position); automatic replacement
Comparison of Lead Profiles Comparison of Chromium Profiles Simple analysis software (PCEDX-Navi)
in Copper Alloys in Copper Alloys Software General analysis software (PCEDX-Pro)
Brochure No. C142-E047
Integrated EDX–FTIR Analysis Software
EDXIR-Analysis

Systems
The integrated EDX–FTIR analysis software, EDXIR-Analysis is especially for
qualitative analysis, utilizing data acquired with energy dispersive X-ray
X-ray and Surface Analysis
fluorescence spectrometers (EDX) and Fourier transform infrared
spectrophotometers (FTIR). This software provides identification results and
degrees of matching by performing an integrated analysis of data acquired
with FTIR, which is ideal for the identification and qualitative analysis of organic
compounds, and data acquired with EDX, which is ideal for the analysis of the
elements contained in metals and inorganic compounds. It can also perform EDX profile FTIR spectrum
either EDX or FTIR analysis separately. Shimadzu's proprietary library (containing
485 data as standard), created through cooperation with waterworks agencies Loading the acquired data
and food product manufacturers, is used for the data analysis. Additional data
as well as image files and document files in PDF format can be registered in the
library. It is also effective for linked storage with a variety of data as digital files.
Integrated Analysis for Contaminant Analysis and Data Integrated Data
Comparisons for Confirmation Tests data analysis comparison
The examples here show an integrated analysis of black rubber contaminant
data acquired and a data comparison for a polyvinyl chloride (PVC) examination
object and the standard product. From the integrated data analysis results, it is
evident that the black rubber contaminant is acrylonitrile-butadiene rubber
(NBR), which contains calcium carbonate and zinc stearate. In addition, from
the data comparison, the degree of matching between the PVC examination
object and the standard product is 0.8506. Lead (Pb) and acrylic were detected
from the EDX and FTIR data, which were not detected in the standard product. Integrated Data Analysis Results Data Comparison Results
Accordingly, it is surmised that the examination object contains components for a Black Rubber Contaminant for a PVC Examination Object
different to those in the standard product. and the Standard Product
Brochure No. C103-E112
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