Page 41 - 2023 Shimadzu Analytical and Measuring Instruments

X-ray Fluorescence Spectrometers

Energy Dispersive X-ray Fluorescence Spectrometer Energy Dispersive X-ray Fluorescence Spectrometer for RoHS/ELV Screening
EDX-8100 EDX-LE Chromatography Systems

Equipped with an electronically cooled high-performance semiconductor The software is loaded with the optimal functions for screening, Mass Spectrometry Systems
detector, the EDX-8100 is designed for reduced running costs and ease of including automatic calibration curve selection and automatic reduction
maintenance while providing better sensitivity, throughput, and resolution of measurement time. Utilizing optional analysis kits, the EDX-LE can
than conventional models. The EDX-8100 is a model that accommodates also accommodate screening analysis of halogen compounds and Life Science Lab Systems
light elements and allows for helium purge. A wealth of optional antimony that are subject to regulations. Furthermore, in combination
functions is available, including a vacuum measurement unit, which is with the optional Additional Function Kit, the instrument can also be
effective for light element analysis, and a turret unit, which is effective for used for applications besides screening, such as qualitative analysis, film
consecutive analyses. From management applications involving thickness analysis, and steel grade determinations utilizing general
compliance with RoHS/ELV directives and other environmental regulations analysis software.
to research applications involving the high-level needs of general sample Elements to be determined 13Al to 92U
analysis, the EDX-8100 can be applied broadly, whatever the industry. Sample chamber dimensions 370 (W) × 320 (D) × approx. 155 (H) mm max.
Primary filters 5 types (6 including the open position); automatic replacement Spectroscopy Systems
Elements to be determined 6C to 92U
300 (W) × 275 (D) × approx. 100 (H) mm max. Software Screening software
Sample chamber dimensions (Assuming no rounded corners) Options Halogen Screening Analysis Kit
Primary filters 5 types (6 including the open position); automatic replacement RoHS, Halogen, Antimony Screening Analysis Kit
Brochure No. C142-E044 Brochure No. C142-E035

Multi-Channel X-ray Fluorescence Spectrometer
MXF-2400 Systems X-ray and Surface Analysis

The MXF-2400 features a compact design and ease of operation. The Measurement Systems Environmental
latest hardware designed to fully utilize the principle of X-ray
fluorescence spectrometry and the data processing unit that uses
various software programs to permit automatic management of analysis Systems Non-Destructive Inspection Material Testing and
data combine to provide high analytical productivity both in R&D and
production control. Up to 36 elements can be simultaneously
determined by the fixed monochromator and up to 48 elements can be
determined sequentially by the optional scanning monochromator. High
analytical precision is provided even in high sensitivity analysis of a few
ppm quantity level.
Elements to be determined 5B, 6C, 7N, 8O to 92U
Converging system Curved crystal Measurement Systems Physical Properties
X-ray tube 4 kW with a thin window
Brochure No. C142-E024

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