Page 15 - Electric&Electronics - Total Solution for Analyzing Electronic Devices

Evaluation of Additives and Hazardous Substances

Measurement of Hazardous Substances

● Screening for Elements Regulated by RoHS/ELV Directives ● Evaluation of Halogen-Free State in Electrical/Electronic Materials
● Analysis of Elements in Layer Structure and Elemental Analysis of Contaminants ● Measurement of Sulfur Components in Chemical Materials

Energy Dispersive X-Ray Fluorescence Spectrometer Anion Chromatograph
EDX-7200 / 8100 HIC-ESP

Compound-type solar cells are made by depositing a thin lm of a In an effort to reduce environmental impact, halogen-free soldering materials are now commonly
compound on a substrate by sputtering or another method. Energy used to address increasing requirements for reducing the content of halogen compounds in solder
dispersive X-ray uorescence spectrometers provide a very convenient materials used in electrical/electronic equipment. The Japan Electronics and Information Technology
means of quickly and non-destructively measuring CIGS thin lms. Industries Association (JEITA) has established standards for halogen-free soldering materials, both in
terms of ensuring inherent solder bonding characteristics and reducing environmental impact. Those
standards specify using pyrolysis to decompose ux solids and ion chromatography to measure the
CIGS Quantitative Analysis halogens as the test method to be used for determining the halogen content.
Diagram of Measurement Sample Qualitative Analysis Results from CIGS Film Sample No. 1
(Quantity Deposited) Results
Layer Sample
Glass substrate (100 % SiO2) Coating quantity
(µg/cm2)
Mo bottom electrode
CIGS thin lm Ion Chromatograph Combustion Unit
CIGS
SiK Thin
Film
MoK Detector Analytical column Injector
Incident X-rays CuK ,InK F, Cl, Br, S, and other
GaK ,SeK Pump gasi ed elements
Mo
Fluorescent X-rays Thin Coating quantity CI
from each layer Film (µg/cm2) Br SO4
Data F
processing Eluent
unit Trapped in absorbing Heated to about
solution 1000 °C
Energy Dispersive X-Ray Fluorescence Spectrometer This system is used to analyze the halogen and Combustion gases from combusting the sample
sulfur content in plastics, lubricant oils, and
at a high temperature are trapped in an absorbing
EDX-LE Plus electronic materials. solution, and then accurately analyzed with an ion Analysis of Solder Flux
chromatograph.
This system can quickly measure samples to screen for the ve elements and
six substances governed by the environmental regulations in the Directive on
the restriction of the use of certain hazardous substances in electrical and
electronic equipment (RoHS Directive), and to screen for the four elements ● Accurate Quantitative Analysis of Substances Regulated by RoHS/ELV Directives
and four substances governed by the environmental regulations in the
End-of-Life Vehicle Directive (ELV Directive) in Europe. It can also be used for ICP Emission Spectrometer and ICP Mass Spectrometer
general material analysis, failure analysis, or plating thickness analysis.
ICPE-9800 Series / ICPMS-2030
The international standard IEC 62321 speci es using ICP optical emission spectrometry,
●Analysis of Phthalate Esters and Brominated Flame Retardants Speci ed in the RoHS Directive ICP mass spectrometry, and atomic absorption spectrometry for accurate measurement
of lead, cadmium, and mercury.
Phthalate Ester Screening System
Py-Screener Ver.2
Sample
Data
Preparation Processing Polyethylene Plastic Analysis Results by Calibration Curve Method
Sample BCR680 BCR681
The Py-Screener system is designed to screen for phthalate esters in plastics. RoHS Detection Pretreatment Certi ed Pretreatment Certi ed
Limit
MW
Wet
Dry
MW
Wet
Dry
In Europe, the use of phthalate esters is restricted under the Directive on the restriction of the Analysis Maintenance Element Max (3σ) Method Method Method Value Method Method Method Value
Limit
use of certain hazardous substances in electrical and electronic equipment (RoHS (II) Directive). Cd 100 0.02 140 140 141 140.8 21.1 21.3 21.6 21.7
Phthalate esters are thermally extracted from samples using a pyrolysis GC/MS (Py-GC/MS) Pb 1000* 0.2 106 < 107 107.6 13.2 < 13.7 13.8
system to selectively detect and quantify any phthalate esters. This screening system includes Cr 1000 0.03 106 112 115 114.6 16.1 17.3 17.9 17.7
Hg 1000 0.2 < 24.2 25.3 25.3 < 4.3 4.4 4.5
dedicated software, special standard samples, a sampling tool kit, and other items prepared As - 0.5 27 30 31 30.9 3 4 4 3.93
speci cally for easy screening of phthalate esters by Py-GC/MS. That ensures the system can be Detection limit with 0.2 g sample pretreated with 20 mL diluent
easily operated even by inexperienced users. < symbol: Less than detection limit *: Max allowable Cr6+
14 15