Page 17 - Electric&Electronics - Total Solution for Analyzing Electronic Devices

Comprehensive Quantitation Functions

Evaluation of Properties Environmental Measurement

Characterization of Thermal Degradation and Thermal Resistance Measurement of Emission Gases and Air Contaminants

● Characterization of Liquid Crystal Materials ● Measurement of Gases Emitted from Components
● Measurement of Clean Room Atmospheres

Thermal Analyzer Thermal Desorption GCMS System
Differential Scanning Calorimeter DSC Measurement of TD-30 Series
Liquid Crystal Material
DSC-60 Plus (Azoxydianisole)
Liquid crystal
to liquid This system adsorbs volatile organic compounds (VOCs) with an
adsorbent and then desorbs them by thermal desorption for
Simultaneous Thermogravimeter and
Differential Thermal Analyzer Solid to injection into a GS-MS system. The solid adsorption-thermal
desorption method is better-suited for measuring trace components
DTG-60(H) liquid crystal than solvent extraction.

TG-DTA Measurement
of Epoxy Resin
Simultaneous Analysis of SVOCs
from VOCs in Indoor Air
To measure indoor air contaminants, a pump with a
constant owrate is connected to the downstream end of a
Tenax-TA sorbent tube to collect samples by suction for 30
minutes to 24 hours. Then the contaminants are isolated by
thermal desorption. That enables simultaneous analysis of
contaminants ranging from toluene to DEHP. (Upper:
Collected from indoor air for 24 hours; Lower: 100 ng
standard mixture sample)
Evaluation of Particle Size Distribution

Measurement of Coarse Particles
(a) Particle Size Distribution
(by Volume)
● Evaluation of Silica Particle Shape and 8
Coarse Particle Content in Electronic Relative Quantity (Frequency) (%) 10 6 Simultaneous Analysis of Cyclosiloxanes, Alkanes,
Component Sealing Materials 4 2 and Phthalate Esters

residues are often contained in oils, liquid rubbers, and
Dynamic Particle Image Analysis System 0 Because cyclosiloxanes are an ingredient in silicone, trace
5 10 50 100 other products. Due to the volatility of cyclosiloxanes, it is
iSpect DIA-10 (b) Scatter Plot 1 Diameter of Equivalent Area (µm) extremely important to control their concentration because
they can cause electronic component failures at contact
X: Diameter of equivalent area points or other areas. TD-30 systems can measure
components ranging from cyclosiloxanes to phthalate esters
The iSpect DIA-10 integrates a particle counter, particle size analyzer, Y: Circularity 0.8 using the same parameter settings.
particle shape analyzer, and other functionality in a single system. 0.6
That means a single system can be used to analyze particle images, Circularity 0.4
analyze particle shapes, measure particle size distributions, detect
contaminants, and measure the number or concentration of 0.2
particles, which previously were accomplished using multiple 0
5 10 50 100
specialized instruments, such as a particle size analyzer and various Diameter of Equivalent Area (µm)
types of microscopes.
(c) Particle Images

50 µm
Results are from measuring commercial spherical silica powder with a nominal
diameter of 50 µm. Only non-spherical particles (with a circularity less than 0.9)
were taken from all particles.
The particle images con rm that non-spherical particles are fragmented or
chipped particles.

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