Page 15 - Shimadzu EPMA-8050G

Simple and Easy-to-Understand Advanced image processing technology

Operations for All Analyses brings out even High Performance

This system is equipped with a number of new functions to enable simple and easy-to-understand Jag-Reduction Function (Standard Equipment)
operations. These include advanced operational performance, with all operations controlled using
just a mouse, as well as an easy-to-understand user interface and a built-in easy analysis mode. While Reduces the whisker-like distortion (caused by mechanical vibration or magnetic eld uctuations) in SEM
easy enough for even novices to use, it also supports sophisticated analysis by experienced users. images that becomes more noticeable at higher magni cation. It uses state-of-the-art image processing
technology that relocates each pixel to the optimum position and reconstructs the image. It reduces image
˔ Easy operations for everything from sample mounting to report generation distortion without compromising the original resolution, resulting in a sharper SEM image.
˔ Even novices can easily perform everything from sample searching to SEM imaging
˔ Unprecedented operability dramatically heightens operational efficiency prior to the
start of the analysis
˔ The user interface has been designed in a visual, easy-to-understand format

˔ Equipped with an easy analysis mode that automates all processes up to generating reports

Before Correction After Correction (Jag-Reduction)
The above image is an example of a SEM image of a gold-deposited particle taken at a magni cation of
×100,000 and compared before and after correction. The corrected image not only reduces the edge
distortion of the large particles, but also clearly shows the shape of the small particles.

View Hold Function (Standard Equipment)

This function prevents the electron beam from deviating from the target foreign matter and outputting the
composition information of the wrong part when performing qualitative analysis of minute foreign matter.

This is an example of the screen with the View Hold function activated. The electron beam is controlled so
that the target in the middle of the SEM image does not move within the rectangular area.
EPMA-8050G
Electron Probe Microanalyzer
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