Page 18 - Shimadzu SPM-9700HT

SPM-9700HT Scanning Probe Microscope

SPM Unit

Example of Optical Microscope Setups

SPM Head
• High Magni cation Optical Microscope Unit
Cantilever Stage (with Camera)
Holder Magni cation of Display Monitor:
Head-Slide 48× to 900× zoom (14-inch display mode)
Mechanism including coaxial epi-illumination
• Optical Microscope Unit (with Camera)
Magni cation of Display Monitor:
100× (14-inch display mode)
Scanner
• Optical Microscope Unit (without Camera)
Magni cation: 40× (20× ocular and 2× objective)
Z-Axis Coarse Example of Observing a Sample and
Adjustment Cantilever Using the High Magni cation
Mechanism Optical Microscope Unit
The splitter slide
mechanism enables
obtaining a bright optical
microscope image.
Field-of-View:
270 m × 180 m
Integrated Cantilever: NCH
Vibration Damper
Splitter-Slide Mechanism
OFF ON

Cantilever

Speci cations for SPM Unit Consumable Parts
Resolution XY: 0.2 nm, Z: 0.01 nm Cantilever for contact mode Si Set of 10 chips~
Max. Scanning HT Scanner Unit X·Y: 10 µm Z: 1 µm (standard) Cantilever for dynamic mode Si Set of 10 chips~
Range (X, Y, Z) Middle Range Scanner Unit X·Y: 30 µm Z: 5 µm (optional) Cantilever for magnetic
Wide Range Scanner Unit X·Y: 125 µm Z: 7 µm (optional) force mode (MFM) Si Set of 10 chips~
Deep-type Scanner Unit X·Y: 55 µm Z: 13 µm (optional)
Narrow Range Scanner Unit X·Y: 2.5 µm Z: 0.3 µm (optional) Cantilever for current mode Si Set of 10 chips~
Stage Max. sample size: 24 mm dia. × 8 mm Cantilever for surface Si Set of 10 chips~
(stage for ø35mm or ø50mm are available as a special order item) potential mode (KFM)
Sample replacement method: * Many other types of cantilevers are also available.
Head-slide mechanism with integrated displacement Contact your Shimadzu representative for details.
detection system and cantilever
Samples can be replaced without removing cantilever.
Sample securing method: Secured with magnets

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