Page 13 - Shimadzu SPM-9700HT

Mapping the Physical Properties of Plastic Films
[µm] [µm] [µm]

[µm] [µm] [µm]
Surface topography Adhesive force Young’s modulus
Mapping analysis can be used to measure adhesive force and Young’s modulus as well as surface topography. The
gure shows a quantitative visualization of the Young’s modulus within a localized area only 300 nm wide on a
plastic lm surface. (Sample source: MORESCO)
Application example Evaluating the uniformity of a polymer material surface

Adhesive Part of an Adhesive Tape

[µm] [µm]

[µm] [µm]
Surface topography Adhesive force

These images are from an evaluation of the adhesive part of an adhesive tape. They show that the adhesive force is
distributed non-uniformly. This demonstrates how the system can be used to evaluate adhesive properties, which
were dif cult to evaluate using conventional methods.

Application example Evaluating the localized adhesive properties of thin lms.

Main Specifications
Force Curve
Measurement Scan (Z) range Settings method Specify end point and width, and automatically track end point
Range Depends on scanner
Scanning speed Frequency setting 0.1 to 100 Hz
Frequency setting step size 0.1 Hz
XY movement Settings method Numerical entry, or speci ed with mouse on SPM image
Range Depends on scanner
Display SPM image data, force curve waveform, measurement parameters, and data analysis results
Mapping
Measurement Physical quantities measured Adsorption force, slope of force curve, Z-position, or elastic modulus
Range Depends on scanner
Resolution 512×512, 256×256, 128×128, 64×64, 32×32, 16×16, 8×8, 4×4, 2×2
Display SPM image data, force curve waveform, and measurement parameters

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