Page 19 - Shimadzu SPM-9700HT

Standard Functions
Contact Mode
This mode creates an image of
displacement in the sample height
direction by scanning the sample surface
with the repulsive force acting between
the cantilever tip and sample kept constant.
Force curves can be measured as well.
Dynamic Mode
This mode vibrates the cantilever near its
resonant frequency. Since the amplitude
changes as the cantilever approaches the
sample, a sample height displacement
image can be created by moving the probe
to keep the amplitude constant.
Force curves can be measured as well.
Phase Mode
This mode detects the phase shift delay in
the cantilever vibration during dynamic
mode scanning. This allows creating an
image of differences in sample surface
properties.
Optional Functions
Current Mode
This mode applies a voltage between a
conductive cantilever and sample
during contact mode scanning and A
creates an image from the distribution
of current ows.
I/V measurement is also possible.
Surface Potential Mode (KFM)
An image can be created from the
electric potential of the sample surface
by applying an alternating current
electrical signal to a conductive + +
cantilever and detecting the static + + V
electric force acting between the
sample surface and cantilever. + + + + + + The scanning direction, force between
+
+
Magnetic Force Mode (MFM)
This mode scans the sample with a
magnetic tipped cantilever kept at a
constant distance from the sample. An
image can be created from magnetic
information of the sample surface
obtained by detecting the magnetic
force from the magnetic leakage eld. N S N S
Sample Heating Unit
The sample can be loaded into the
unit and heated.
Petri Dish Type Solution Cell (special order) Electrochemical Solution Cell
The sample is attached to the bottom of
a small petri dish, which is then lled
with solution. By scanning with the
cantilever immersed in solution, AFM
observations can be performed in
solutions.
Lateral Force Mode (LFM)
By detecting the amount of twist in the
cantilever during contact mode scanning,
an image can be created from
information corresponding to lateral
forces (friction) acting between the
sample and cantilever.
Force Modulation Mode
This mode vibrates the sample at constant
amplitude and frequency during contact
mode scanning. The cantilever response is
detected by separating it into its
amplitude and phase components. This
allows creating an image of differences in
sample surface properties.
Nano 3D Mapping
A force curve can be measured for each point in observed image data to observe a
distribution of sample mechanical properties or adhesive strength.
Adhesion
layer
Sample
Vector Scanning (special order)
the probe and sample, or the applied
voltage can be programmed to allow
scanning according to a program.
Light Irradiation Unit
This unit enables the use of a ber optic
light to irradiate sample
surfaces. It does not include the light
source or the optical ber.
This cell is used for AFM observations
of sample surface changes while an
electrochemical reaction occurs in an
electrolytic solution. The cell includes
three standard electrodes (working,
counter, and reference) and includes
a petri dish type solution cell.
(Does not include the
separately-ordered electrochemical
controller (potentiostat).)
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