Page 23 - Shimadzu EPMA-1720 Series

More evolved trace mapping system *

The trace mapping system maps the No correction Trace mapping
sample surface in real time while
applying corrections for the height
of the sample surface irregularities.
The EPMA-1720 trace mapping
system provides a better visual
expression of the result of the curved
surface approximation of the sample Curved surface approximation
of the sample surface
surface than previous systems.
Enhanced responsiveness of the
height correction operation achieves
more accurate data, and supports
the mapping of smaller regions,
unlike conventional systems.
Steel ball bearing Cross-section through
* Option setting sample surface

Beam adjustment mechanism offers perfect correction.

The axis adjustment mechanisms using a two-stage de†ection coil
are located at two positions, above and below the condenser lens.
Setting optimal conditions for these mechanisms achieves a
high-quality beam axis in all beam current conditions. It is not
necessary to adjust the beam axis each time the beam current
switches from the SEM conditions to analysis conditions.

Intelligent evacuation system
The intelligent evacuation system incorporates a CPU and multiple
sensors to allow continuous monitoring of the vacuum and
operation status from any location and to provide accurate
evacuation control. The graphical instrument monitor window
shows the instrument status at a glance.

EPMA-1720 Series
Electron Probe Microanalyzer 23