Page 22 - Shimadzu EPMA-1720 Series

Continual, Detailed Enhancements Ensure

Excellent Reliability

High-speed, submicron-step sample stage

The new sample stage offers high-speed 15 mm/s max. drive speed in 0.1 µm steps . The precise movements
*
and rapid speed, while maintaining highly accurate repeatability, considerably enhance work efciency.
* 0.02 m minimum steps during analysis

Comparison of Centering Results

Edge-to-edge
travel in approx.
7 sec

0.1 µm steps 1 µm steps
This example shows differences in accuracy for
centering at the center of the par ticle.

Low-acceleration SEM observations

The beam axis can be optimized for each acceleration voltage, making it simple to take
low-acceleration SEM observation. The acceleration voltage can be adjusted in 10 V increments to
restrict charge build-up on non-conductive samples.
Observations of Non-Conductive Samples without Conductive Coating

Acceleration voltage 15 kV Acceleration voltage 920 V

User-management functions
Multiple login user names can be classied into different authority categories for user management.
This protects the security of the system and analysis data when the instrument is shared with other
departments or with multiple guest users.
Browsing, Browsing,
deleting, deleting,
privacy setting privacy setting
Administrator Deleting Privacy setting Deleting Privacy setting

Deleting, Deleting,
privacy setting privacy setting

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