Page 8 - Shimadzu ICPMS-2030 Series

Higher Sensitivity and Lower Interference

Achieve High-Sensitivity and Low-interference

Analyses Using Newly Developed Collision Cell

With this newly developed collision cell, Newly Developed Collision Cell
polyatomic ions that previously may have
been detected as spectral interference are
ef ciently eliminated by helium gas owing
through the cell, allowing the
high-sensitivity analysis.

Quantitative Analysis of As Without Collision Cell With Collision Cell
75
If chlorine is in the sample when performing
quantitative analysis of As, Ar and Cl 75 As 75 As
40
35
75
in HCl 1% in HCl 1%
35
40
combine to form Ar Cl, which overlaps the Blank Blank
mass number of As, creating interference. in HCl 1% in HCl 1%
35
40 Ar Cl interference eliminated
Highly sensitive analysis of As
75
The collision cell eliminates the spectral
interference from Cl, enabling the highly sensitive
measurement of As. 40 Ar 35 Cl
On-Line IEC (Inter-Element Correction)

Shimadzu’s proprietary On-Line IEC (Inter Element Correction) provides correction for spectral interference that could not be eliminated
with the collision cell. Since the interference correction coef cient can be acquired only by a single measurement of a standard sample
of the interfering element, the correction can be simply and accurately made. There's no need for complicated assessments of
conditions, as with reaction cell technology.

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Quantitative Analysis of Se By measuring a standard sample of Gd, the correction coef cient can be obtained.
Then, the portion where interference occurs can be corrected when measuring
If Gd is in the sample when performing quantitative analysis the unknown sample, and the accurate quantitation of Se can be accomplished.
156
78
of Se, spectral interference will occur with respect to Se.
78
78
Measurement of Calculation of Analysis of Calculation of amount of
Gd standard sample correction coef cient unknown sample 156 Gd interference on Se Correction
78
A
α =
B Correction coef cient: α A′ = B′ × α
B Ratio of Gd to
156
A interfering component A′ B′
is constant.
78 Se 156 Gd 78 Se 156 Gd 78 Se 156 Gd 78 Se
Interference of doubly charged 78 Se containing Components Accurate Se
78
78
156
78
ion from Gd appear to Se interference interfering with Se
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