Page 15 - Shimadzu EPMA-1720 Series
P. 15
Unprecedented Easy Operation Boosts
Work Ef ciency Prior to Analysis
Dynamic operations using only the mouse. No other operating aid required.
Right-drag to focus.* Move samples (like using a track ball).*
Sample moves with cursor position.
Double-click to center.* Move field of view (like using a joystick).*
Designated position moves to the center of the image. Field of view moves from center of screen toward the cursor.
* Perform operations on either the optical microscope image or the SEM image.
Simple, quick, and accurate adjustment of beam current, while maintaining focus
Simply designate the target beam
current for quick and accurate
automatic setting.
Interlocking control ensures that
focus is maintained when the beam
current is changed.
Sample current: 0.5 nA Select from menu Sample current: 10 nA
Clear BSE images even during rapid scanning
A newly developed 4-block
semiconductor detector is used as the
BSE detector.
In Shimadzu’s EPMA, the detector is
uniquely positioned to enable high
Conventional TV scan image
collection efficiency and achieve
EPMA-1720 TV scan image
excellent response speed and sensitivity.
It ensures clear BSE images even during
rapid scanning.
EPMA-1720 Series
Electron Probe Microanalyzer 15
