Page 45 - Solutions for Plastic Evaluation
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                                       Scanning Probe Microscope                                     Product Information

                                                                                                      Product Evaluation



               Analysis of Plastic Samples Using an SPM
               Scanning probe microscope (SPM) is a generic term for microscopes that scan sample surfaces with a microscopic probe to
               observe their three-dimensional shape or surface properties at high magnifications. SPMs are used for applications such as to   Plastic Materials  Evaluation of
               observe the surface of plastic materials and products, or analyze their structure or inspect foreign matter. SPMs allow observing
               three-dimensional surfaces with higher resolution and magnification than optical or electron microscopes. Even insulating
               samples can be observed directly without modification. SPMs can be used to observe not only shape, but also to measure other
               physical properties, such as electrical properties, viscoelasticity, and hardness.

               Shimadzu Scanning Probe Microscope
               Features of the SPM-9700                                                                               Raw Materials  Evaluation of

               • High Stability and High Throughput
                  A  head-slide  mechanism  allows  sliding  the  entire  optical  lever  system  as  an
                  integrated unit. This means samples can be replaced without removing the cantilever
                  and samples can be approached completely automatically, regardless of sample
                  thickness. It also contributes to high throughput by allowing access to samples even
                  during observation. Due to the laser light shining continuously even during sample   SPM-9700
                  replacement, stability is higher, which provides clearer and higher quality images.

               • Functionality and Expandability Satisfies a Wide Range of Requirements                                Product Evaluation
                  Standard functionality includes contact, dynamic, phase, lateral force, and force
                  modulation  functions.  In  addition,  functionality  can  be  expanded  to  include
                  electrical current, magnetic force, surface potential, nano-indentation, or nano-
                  thermal analysis functions.

               • Ease of Operation Minimizes Distraction Throughout Steps from Observation
                to Analysis
                  Easy-to-understand graphical user interfaces (GUI) are used for functions, such as                   Product Information
                  the guidance function and navigation function.

               • Wide Variety of 3D Rendering Functions Using Mouse Operations
                  3D operations, such as rotating or smoothing, can be performed freely in real time.
                  It includes texture and 3D cross sectional profile analysis functions that can be
                  overlaid on height or physical property information.


               Environment Controlled SPM
               Features of the WET-SPM Series
               By  adding  an  environment  controlled  chamber,  SPM-9700  series  SPMs  can  be
               upgraded to a WET-SPM series system. Since the chamber is a glove box system,
               samples can be prepared (such as cleaving, rinsing, heating, and drying) or replaced
               within  controlled  environmental  conditions.  Depending  on  the  combination  of
               functions  and  sample  operations,  some  of  the  environmental  controls  available   WET-SPM Series
               include the following.

               • Specific gas environment control
               • Environmental temperature and humidity control
               • Sample heating and cooling
               • Blowing gas on samples
               • Shining light on samples
               • Application of stress on samples








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