Page 7 - Material Characterizations
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Wavelength Dispersive X-Ray Fluorescence Spectrometer WDX
Sequential XRF Spectrometer
XRF-1800
Key Features and Capabilities
• Solid, liquid, powder & thin film • World-first 250µm mapping
• Air, vacuum and helium-purged* environment • Qualitative / quantitative analysis using higher order X-rays
• 4kW generator mated to a high performance X-ray tube • Film thickness measurement
• Two detectors (ie. Scintillation Counter & Flow Proportion Counter) • Inorganic component analysis for high-polymer thin film
• Wide-area analysis (ie. 10mm-30mm) • Integrated instrument and workbench design
• Local-area analysis (ie. 500µm-3mm) • High-speed sample loading system
Measurement Range • Standard 8O to 92U • Optional 4Be to 92U
Position 1 Mapping of Rare Earth Ore by XRF-1800
Position 2
Ba Ce La Ca
Multi-Channel XRF Spectrometer
MXF-2400
Key Features and Capabilities
• High throughput with high level of automation • Spectrometer with scanning monochromator*-One detector
• Solid, liquid & powder (ie. Scintillation Counter)
• Air, vacuum and helium-purged* environment • Small foot-print with compact design
• 4kW generator mated to a high performance X-ray tube • High sensitivity
• Simultaneous analysis of up to 36 elements • High precision
• Spectrometer with fixed monochromator-Two types of detector
(ie. Gas Sealed Detector & Flow Proportion Counter)
Measurement Range • 4Be to 92U (Maximum)
Excellence in Science 11
