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Various Support Functionality Achieves Fast Observation
Observation times have been significantly shortened with faster observation and physical property-mapping processes.
Simple sample and cantilever replacement processes ensure the system can be prepared for observations quickly.
Three functions enable significantly shorter observation times.
High-Throughput Observation Simple & Smooth Sample Easy and Reliable
Fast Physical Property Mapping Replacement Cantilever Replacement
High-Throughput Observation
Fast Physical Property Mapping
The data acquisition time required for observation and mapping physical properties has been significantly shortened
by using a high-throughput scanner that achieves a fast response and by optimizing the control algorithm.
About 25 sec. for observation* About 21 min. for observation*
Observation of TiO2 Atomic Steps Mapping Elastic Modulus of High Density
Polyethylene
2.50 µm
2.50 µm
1.00 µm × 1.00 µm
* Actual observation times will vary depending on parameter settings.
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