Page 12 - Shimadzu SPM-Nanoa

Nano 3D Mapping Fast Optional
™

—Fast Physical Property Mapping—

The mechanical properties of materials can be evaluated by measuring the force (force curve) acting on the cantilever
probe as its distance from the sample surface is varied.
The faster measurement system enables high-speed mapping of physical properties.

Force Curve Measurement

Cantilever

Probe

Sample

Cantilever Responses to Forces During Force Curve Measurements

Repulsion
Load: Elastic modulus:
Force between Probe and Sample Calculated from theoretical model Z-Position By acquiring a force curve at various points on
Precisely controlled in the order of pN and nN

the sample surface, the physical properties in the
XY-plane can be mapped.
This is especially useful for evaluating the
mechanical properties of thin films that are
Adhesion
difficult to measure even with a nanoindenter or
soft materials with a hardness between about a
few kPa and 1 GPa.
Attraction
Force Curve

˙ Mapping the Elastic Modulus of Styrene-Butadiene Rubber

Measurement Points

3.00 µm × 3.00 µm 3.00 µm × 3.00 µm Modulus of Elasticity (MPa)
Surface Shape Elastic Modulus Histogram of Elastic Modulus

Mapping the elastic modulus of styrene-butadiene rubber (after Soxhlet extraction)
allowed evaluating the uniformity of the material based on the elastic modulus histogram.
(Sample source: Professor Nakajima, Department of Chemical Science and Engineering, Tokyo Institute of Technology)

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