Page 17 - Shimadzu IRTracer-100
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Electrical, Electronics, and Semiconductors Automobiles Academia
Thickness measurement of epitaxial films Material identification tests Research & Development
Quantitative analysis of interstitial oxygen and substituted carbon Analysis of contaminants Educational laboratories
Quantitative analysis of phosphorus and boron in BPGS Failure analysis
Quantitative analysis of hydrogen concentration in nitride film
Quantitative analysis of hydrogen concentration in amorphous silicon Metals
Detection of brominated flame retardants (RoHS) Qualitative analysis of thin films on metal plates
Analysis of thin films Analysis and thickness measurement of thin films
Analysis of contaminants Analysis of contaminants
Failure analysis
Analysis of semiconductor gases Construction
WEEE Material identification tests
Degradation analysis of coatings
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