Page 17 - Shimadzu IRTracer-100
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Electrical, Electronics, and Semiconductors  Automobiles                     Academia
              Thickness measurement of epitaxial films     Material identification tests      Research & Development
              Quantitative analysis of interstitial oxygen and substituted carbon  Analysis of contaminants  Educational laboratories
              Quantitative analysis of phosphorus and boron in BPGS  Failure analysis
              Quantitative analysis of hydrogen concentration in nitride film
              Quantitative analysis of hydrogen concentration in amorphous silicon  Metals
              Detection of brominated flame retardants (RoHS)  Qualitative analysis of thin films on metal plates
              Analysis of thin films                       Analysis and thickness measurement of thin films
              Analysis of contaminants                    Analysis of contaminants
              Failure analysis
              Analysis of semiconductor gases            Construction
              WEEE                                        Material identification tests
                                                          Degradation analysis of coatings







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