Page 9 - Shimadzu EDX-LE Plus

Fully Equipped with Essential Functions

All-in-One Design Includes All Functions for RoHS/ELV Screening

Overall RoHS/ELV analysis performance is tied to the smooth coordination of a variety of analytical Qualitative-Quantitative Analysis
systems. General analysis software is included as standard, to support
For this reason, EDX-LE Plus standard equipment includes all the functions required for RoHS/ELV non-standard quantitative analysis based on the FP method.
analysis, providing users with the optimal RoHS/ELV screening system.

Obtaining Highly Reliable Analytical Results Organize Measurement Results in a List
Calibration Curve Method and FP Method List Creation Function -FeKa
®
To improve the reliability of analysis results for elements List data stored in Excel le format.
speci ed by the RoHS/ELV directive, the elements are
analyzed using the calibration curve method and standard
sample (check sample) provided with the instrument. (The X-ray Fluorescence Intensity
Fundamental Parameter (FP) method is used instead for -CrKa
some RoHS elements in metal samples.) Any other elements Quantitative Analysis Results for
detected are analyzed using the FP method, which uses -CrKb MnKa -FeKb Stainless Steel (FP Method)
theoretical calculations to provide additional information. -NiKa
-V Ka -CuKa -NiKb -CuKb -Moka -Mokb -RhKa -RhKb
Compensates for the In uence of 5 10 15 20 25 [keV]
Differences in Shape of Actual Samples Note that this requires installation of Microsoft Of ce Excel before use. Qualitative Pro le of Stainless Steel
®
®
on Analysis Results
Shape Correction Function Accommodates a Variety of Samples
X-ray intensity differs with the shape and thickness of Sample Observation Function Thin-Film Analysis
samples, even if they contain the same material, and will When measuring foreign substances and samples with The Film FP method obtains not only single layer, but multilayer lm thickness, composition, and deposit volume.
have an impact on quantitative values. EDX-LE Plus utilizes a multiple parts, the sample observation camera allows the It is also well-suited to the measurement of Pb contained in plating. (Information is needed about the constituent elements
*
BG internal standard method to eliminate the effect of shape analysis position to be speci ed easily by checking the camera and the layer order including the base.)
and thickness, providing highly precise results.
image. If the sample is small or if speci c locations on the
160 sample are being measured, the collimator can be used to Result of Qualitative Analysis
140 change the X-ray exposure region. P Ni Pb
120
100 −P Ka −Nika
80 Quantitative
Value with
60
Correction
40
Quantitative
20 Value with X-ray Fluorescence Intensity X-ray Fluorescence Intensity X-ray Fluorescence Intensity
0 No Correction
Mold Multiple Pellet 1 Film Film Film Film Variant
Standard Value pellets center 1 layer 2 layers 3 layers 4 layers
Comparison of Quantitative Results
with BG Internal Standard Correction/No Correction −PbLb1
* BG internal standard method:
Fluorescent X-ray intensity of each element is standardized using scattered X-ray intensity. 1 2 3 [keV] 7 8 [keV] 12 13 [keV]
10 mm dia. image (plastic) 3 mm dia. image (metal) * Trace amounts of lead as a stabilizer detected
Large Sample Chamber Result of Quantitative Analysis
Layer Info Analyte Result (Std. Dev.) Proc.-Calc. Line
Despite its compact
Total
body, the EDX can Elem. Quan
Elem. Quan
accommodate samples Elem. Quan
up to W370 mm × Elem. Fix
D320 mm × H155 mm.
Example of Measurement of Electroless Ni-P Plating

EDX-LE Plus
8 Energy Dispersive X-ray Fluorescence Spectrometer 9