Page 2 - Shimadzu Axis Supra+

X-RAY PHOTOELECTRON
SPECTROSCOPY

X-ray Photoelectron Spectroscopy (XPS), also known
as Electron Spectroscopy for Chemical Analysis
(ESCA) is a widely used analytical technique for the
surface characterisation of materials. Typically using
monochromated Al Ka excitation, XPS provides quantitative
chemical information from the uppermost 10 nm of
a material. The technique is used in both industrial
and academic research, characterising surfaces with
technological applications as diverse as organic light
emitting diodes or superhard, inorganic coatings.

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THE AXIS SUPRA
– IMPROVED PERFORMANCE

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The next generation AXIS Supra , with
enhanced performance over its predecessor,
combines market leading spectroscopic and
imaging capabilities with automation to ensure high
sample throughput and ease of use. Unrivalled large area
spectroscopic performance allows photoelectron spectra
to be acquired. Fast, high spatial resolution XPS imaging
reveals the lateral distribution of surface chemistry and aids
further characterisation with selected area analysis.
ESCApe integrated acquisition and processing software
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allows the AXIS Supra to perform to its maximum
capability and provides an easy interface with the
spectrometer.
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The AXIS Supra is set apart from any other spectrometer
by complete automation through computer control of
sample handling and instrument parameters. Unattended
sample holder transfer and exchange during analysis is
achieved by coordination of the Flexi-lock sample magazine
and sample analysis chamber autostage.

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CAPABILITIES OF THE AXIS SUPRA
LARGE AREA, HIGH SENSITIVITY XPS
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The AXIS Supra is optimised for chemical
state X-ray photoelectron spectroscopy.
Efficient collection of photoelectrons combined
with high transmission electron optics ensures
unrivalled sensitivity and resolution at large analysis areas.
As well as conventional scanned acquisition, spectra may
be acquired in fast, unscanned snap-shot mode in less
than a second making use of the 128 channel Delay-Line
Detector (DLD).
Key attributes include:
• Easy detection of light elements.
• Excellent signal-to-noise, even at low concentrations.
• Fast data acquisition.

• Scanned or snap-shot spectral acquisition modes.

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