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                              Analysis of Foreign Substances                                          Product Evaluation

                                                                                                           FTIR



               Analysis of Foreign Substances on Film Using an Infrared Microscope
               The following are results from using an infrared microscope and the attenuated total
               reflection (ATR) method to analyze trace contaminants discovered on the surface of                     Plastic Materials  Evaluation of
               film. The fibrous substance, which was about 5 µm wide, and the film surface were
               both measured to obtain a differential spectrum. From the resulting spectrum it was
               determined that the fibrous substance was cellulose fibers. In this way, an infrared
               microscope  and  ATR  method  can  be  used  to  obtain  information  about  sample
               surfaces, such as difficult-to-sample substances adhered to sample surfaces, without
               any pretreatment.                                                      Microscope Photograph of Foreign
                                                                                           Substance on Film
                                                                                          Red box: 50×100 µm          Raw Materials  Evaluation of



















                  Measurement Results from Foreign Substance (Black) and Normal Area    Differential Spectrum (Cellulose)   Product Evaluation




               Infrared Microscope
                                                                                                                       Product Information
               Infrared microscopes focus condensed infrared light on a sample and detect the light passed through or reflected from the sample
               with a highly sensitive MCT detector. This enables measuring very small samples and micro areas that cannot be analyzed using the
               FTIR system alone. Transmission, specular reflectance, ATR or other methods can be selected depending on the measurement sample
               and purpose of analysis, which is extremely helpful for analyzing defects, such as foreign substances or deterioration, identifying
               the respective layers of multilayer films, or analyzing micro-areas. Samples can be measured (transmittance or specular reflectance
               measurement) by viewing the sample in the same manner as operating an optical microscope, and then specifying the measurement
               location using the auto aperture. Unlike other instruments that analyze micro-areas by irradiating samples with high-energy visible
               near-infrared laser light, X-rays, or electrons, infrared microscopes cause almost no change or damage to samples.
















                               Infrared Microscope System
                                                                           Photographs from Infrared Microscope




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