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Analysis of Foreign Substances Product Evaluation
FTIR
Analysis of Foreign Substances on Film Using an Infrared Microscope
The following are results from using an infrared microscope and the attenuated total
reflection (ATR) method to analyze trace contaminants discovered on the surface of Plastic Materials Evaluation of
film. The fibrous substance, which was about 5 µm wide, and the film surface were
both measured to obtain a differential spectrum. From the resulting spectrum it was
determined that the fibrous substance was cellulose fibers. In this way, an infrared
microscope and ATR method can be used to obtain information about sample
surfaces, such as difficult-to-sample substances adhered to sample surfaces, without
any pretreatment. Microscope Photograph of Foreign
Substance on Film
Red box: 50×100 µm Raw Materials Evaluation of
Measurement Results from Foreign Substance (Black) and Normal Area Differential Spectrum (Cellulose) Product Evaluation
Infrared Microscope
Product Information
Infrared microscopes focus condensed infrared light on a sample and detect the light passed through or reflected from the sample
with a highly sensitive MCT detector. This enables measuring very small samples and micro areas that cannot be analyzed using the
FTIR system alone. Transmission, specular reflectance, ATR or other methods can be selected depending on the measurement sample
and purpose of analysis, which is extremely helpful for analyzing defects, such as foreign substances or deterioration, identifying
the respective layers of multilayer films, or analyzing micro-areas. Samples can be measured (transmittance or specular reflectance
measurement) by viewing the sample in the same manner as operating an optical microscope, and then specifying the measurement
location using the auto aperture. Unlike other instruments that analyze micro-areas by irradiating samples with high-energy visible
near-infrared laser light, X-rays, or electrons, infrared microscopes cause almost no change or damage to samples.
Infrared Microscope System
Photographs from Infrared Microscope
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