Page 16 - Material Characterizations

X-Ray

Photoelectron
Spectrometer

XPS

X-Ray Photoelectron Spectrometer (XPS) analyses
the chemical compositions and chemical state in a
material. Sampling depth is typically 10nm. It is
a critical tool for material failure analysis as well

as cutting-edge material innovation and
development. XPS is also known as Electron
Spectroscopy for Chemical Analysis (ESCA). AXIS SUPRA

How It Works
An X-ray source imparts photons of energy onto sample. The
absorbed energy causes some electrons to break free from its shell and
eject out. They are guided and assisted towards a detector by electrostatic
and magnetic lens in a ultra high vacuum atmosphere. XPS has
spectroscopy and imaging capabilities. It can measure all the elements
except hydrogen (Z=1) and helium (Z=2). Modern XPS is also capable of
multiple analytical techniques, eg. auger electron spectroscopy (AES)
and ultra-violet photoelectron spectroscopy, that increase its AXIS NOVA
functionality.

Major Advantages Areas of Application
High resolution analysis of surface • Semiconductor • Biotechnology
of materials. Wide applications • Catalyst • Fabric
in various industries. • Thin film coating • Glass
• Polymer & plastic • Battery
• Magnetic memory • Cosmetics
• Nanotechnology Amicus

20 Excellence in Science