Page 20 - Material Characterizations

Scanning

Probe

Microscope

SPM

Sample observation down to atomic resolution.
It is used for surface morphologic and topographic

study.

How It Works
SPM consists of a cantilever with a sharp tip at its end that is used to scan
the sample surface. When the tip is brought into close range of a surface,
forces between the tip and surface cause a deflection of the cantilever. A
laser spot is used to measure the deflection by reflecting it off the top
surface of the cantilever onto a detector. Several forces can be imaged,
measured and even manipulated. Some common examples are mechanical
contact force, magnetic force, electric current etc. Measurements can be
done in air, vacuum or liquid environment. Effects of temperature,
humidity, gas and electrochemistry on samples can be studied.

Major Advantages Areas of Application SPM-8000FM

Ultra high resolution analysis • Living organisms, eg. E.coli bacteria
of surface of materials. • Metals, eg. boundary surface of plating layer
A wide variety of sample • Non metals, eg. ferroelectric domains
characteristics can be • Minerals, eg. observation of calcite in solution
analysed. Relevant to a • Ceramics, eg. film dispersed with silica
big spectrum of industry. • Polymers, eg. Li-ion battery separator
• Powders, eg. toner particle
• Nanotechnology, eg. rendering images using
electric potential
• Thin films, eg. cross-section of the film
• Semiconductors, eg. electric potential analysis of
organic thin film transistor
• Coatings, eg. baking finished surface SPM-9700

24 Excellence in Science