Page 24 - Material Characterizations

XRD

OneSight Wide-Range

High-Speed Detector

High-Speed Detector With 1280 Channels Achieves
High-Speed, High-Sensitivity Performance

The OneSight consists of a semiconductor Si sensor array. It achieves an intensity
approximately 100 times higher than that obtained by a scintillation detector. The
OneSight can also perform wide-angle range measurement without a scanning
goniometer for significantly higher throughput. It can be easily mounted on existing
XRD-6100/7000 units at customers’ sites*.

*It is necessary to set up the OneSight parameters during the initial installation. It may be necessary
to update the software and hardware. For more details, please contact your representative.

ONE SHOT Function Achieves
Simultaneous Measurement of
Diffration Profile at a Wide
Range Angle

The OneSight can perform a simultaneous
diffraction profile measurement at more than
10 deg. angle range without a scanning
goniometer. This is useful for quantitative
when using a specified diffraction peak.
NEW
Standard Sample Data of Asbestos (Chrysotile)
(30 sec. measurement time per sample)

High-Speed Quantitative
Analysis using Three
Types of measurement
Modes

The OneSight features three kinds
of measurement modes: High
Solution, Standard, and Fast. It
enables measurement speed 10
times faster (high resolution), 15
times faster (standard), and 25
times faster (fast) than those
attained with a scintillation detector.

28 Excellence in Science