Page 9 - Hydrocarbon Evaluation Rubber and Plastic
P. 9

•Scanning Probe Microscope
            SPM-9500J3
            High-resolution observation even of non-
            conductive sample is possible in air
            without pretreatment, and high-precision
            measurement of topographical images and
            material surface roughness are possible
            with high magnification factors ranging
            from several thousand to several million.                             ■Analysis of rubber materials
                                                                                  These are images of special phase-changing of special
            [Main Applications]
                                                                                  rubber observed at room temperature (left) and after being
            Topographic observation, viscoelasticity                              heated for 5 minutes at 100°C (right). The changes in the
                                                                                  surface shape can be clearly observed. (Sample heating unit
            measurement, “sea-island” structure                                   used.)
            analysis, lamella structure analysis, folded
            structure observation, shape observation
            of heated samples, research and
            development, failure analysis, etc.



            •Scanning Electron Microscope  SSX-550
            The SSX-550 is a cutting-edge SEM-EDS combined system
            that enables micro-level shape observation and elemental
            analysis for surfaces in a comfortable operating
            environment.
            With a design putting weight on low-acceleration voltage
            observation, non-conducting samples can be observed
            without troublesome pretreatment. Also, low-vacuum
            observation functions enable non-evaporation EDS analysis.
            [Main Applications]
            Topographic observation, analysis of additives, acceptance
            inspection of raw materials, failure analysis, handling
            complaints, etc.










            •Electron Probe Microanalyzer  EPMA-1600/1610
            Observation and high-sensitivity elemental analysis of samples is
            possible at the micron level. The EPMA-1610 can perform
            analysis at the sub-micron level.
            [Main Applications]
            Analysis of the distribution and precipitation of additional
            elements and solid solution elements, observation and
            analysis of treated surfaces (e.g. wiper surfaces),
            failure analysis (e.g., observation of surface
            deterioration), product development, etc.










                                                          9   Evaluation of Additives and Harmful Substances
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