Page 10 - Shimadzu SPM-8100FM
P. 10
Main Specifications External Appearance of Instrument
1. SPM Unit 2. Control Unit
Resolution X, Y: 0.2 nm, Z: 0.01 nm Control Unit Feedback Digital control Control unit
SPM Head Displacement Light source/optical lever/detector Communications Interface 1000Base-T, TCP/IP protocol SPM unit Monitor Host computer
detection system Drive Unit X/Y-axis control -211 to + 211 V, 16 bit
Light source Laser diode (635 nm, 5 mW max., switchable ON/OFF) Z-axis control -211 to + 211 V, 16 bit
Irradiates cantilever continuously, even while replacing samples. Analog Unit Input voltage -10 to 10 V
Detector Photodetector Resolution 16 bit FM unit
Noise level converted 20 fm/√Hz max. Sampling frequency 200 kHz FM demodulator
to displacement Input signal 8 channels
Scanner Drive element Tube piezoelectric element Amplifier unit
Max. scanning size 10.0 µm × 10.0 µm × 1.0 µm (X, Y, Z) 3. Data Processing Unit Amplifier for optical lever signal
Stage Max. sample size 38 mm dia. × 8 mm Host Computer Main memory 16 GB min. Optical
Analog unit
Sample Head-slide mechanism External Internal hard drive with minimum 250 GB Various signal I/O microscope
replacement method recording device One CD-RW drive
Sample Magnet Communications interface 1000Base-T, TCP/IP protocol Driver unit
securing method OS Windows ® 10 Professional (64 bit), English version High voltage signal generator
Motor control
SPM head 10 mm × 10 mm Monitor Panel 21-inch wide-screen TFT LCD Control unit
movement range Display resolution: 1920 × 1080 pixels Various digital signal processing
Z-Axis Coarse Method Fully automatic, using stepping motor 4. Software
Adjustment Max. stroke 10 mm
Mechanism Online Observation Maximum 8 images can be displayed simultaneously. Coaxial incident illumination
window Cross section shape can be displayed during scanning Note: The equipment table is optional.
Optical CCD Element size: 1/3 inch Note: Dual monitors setup is available as an option.
Scanning mode Switchable between XY, ZX, and ZXY
Microscope Effective pixels: 1024 × 768
Control screen Observation parameters can be specified
Lens Stroke: 65 mm
Optical magnification: 4x Offline Summary display Summary of images can be displayed as thumbnails
Image data Display, process, or analyze image data Installation Specifications
Illumination Coaxial incident illumination
display/analysis Display or analyze 3D mapping data
Vibration Vibration damper Built into SPM unit
Isolation System
Installation Room Power Supply
Environment The following power supply is required to operate
Optional Products The installation room environment this system.
should meet the following conditions. Single-phase 100 V AC, 50/60 Hz, 15 VA, 2-prong
Narrow Range Scanner (2.5 µm) Middle Range Scanner (30 µm) Petri Dish Type Solution Cell Cantilever Mounting Jig Temperature: 23°C ± 5°C Ground resistance 100 max.
Humidity: 60% max. (no condensation)
Instrument Size and Weight
SPM unit : W200 × D220 × H370 mm; approx. 10 kg
Control unit: W600 × D600 × H1,300 mm; approx. 130 kg
Used for observation in a narrow range. Used for observation in a wide range. Used for observation in liquid. This jig ensures easy and secure
X·Y: 2.5 µm Z: 0.3 µm X·Y: 30 µm Z: 5 µm The dedicated cantilever holder is included. mounting of the cantilever.
Installation Example
Air-Cushioned Vibration Damper Active Vibration Damper Active Vibration Damper with Dedicated Stand Additional Monitor
Unit: mm
Power strip
Compressed air 3000 Power
Power (assuming an air-spring vibration damper is included) supply
supply
This is a floor-type passive vibration damper. This is a table-top active vibration damper. This is the active vibration damper unit combined Add a second monitor (optional) for a dual
It requires a compressed air source. It only requires a power supply to function. as a set with a matching dedicated stand. monitor. The connection cable is included. Monitor Monitor (optional)
Control unit
Particle Analysis Software Signal Monitor Static Eliminator Signal
W600×D600×H1300 monitor
Approx. 130 kg (optional)
Coaxial Host
incident SPM unit computer
illumination
Vibration damper Table
(optional 900 × 700 vibrationdamper shown as an example) (optional 1200 × 800 table shown as an example)
Extracts multiple particles from image data and An arbitrary signal can be taken and This is used to eliminate static charge
calculates characteristic values for each particle. shown on the screen using online software. from samples or cantilevers.
SPM-8100FM
10 High Resolution Scanning Probe Microscope 11