Page 3 - Shimadzu LCMS-IT-TOF

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High Resolution & High Precision in MS measurement
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The stable, high-resolution spectra achieved throughout a wide mass range and high-precision MS data are de-
rived from the DSR: Dual-Stage Reflectron (*1) and the use of BIE: Ballistic Ion Extraction (*2) . These instrument
advances can strongly assist in the use of MS for predicting accurate structural details.

High Throughput
Increased amounts of information are obtained for each measurement, enabling much higher reliability in struc -
tural analysis. High-throughput analysis can be realized with the world’s best performance hybrid MS used for
structural analysis in terms of high-speed mass spectrum measurement and high-speed ion polarity switching.

High Sensitivity

High-sensitivity detection of low concentration samples is derived through the use of Compressed Ion Injection
(CII) within the ion optics (*3) , allowing for the ions to be placed efficiently into the ion trap.

*1 Patent US6384410, US6803564 and others
*2 Patent US6380666 and others
*3 Patent US6700116 and others

Contents

P 04 - Original and Advanced Technology

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P 06 - High-Speed and High-Precision MS Measurement
P 08 - Basic Performance Supporting High-Quality Data

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P 10 - Intelligent Auto MS Function
P 12 - Software to Accelarate Data Analysis