Page 12 - Shimadzu EDX-LE

RoHS Compliance Screening Analysis Instruments

Energy Dispersive X-ray Fluorescence Spectrometer Screening System for Phthalate Esters
EDX-7000/8000/8100 Py-Screener

• High Sensitivity, High Speed, and High Resolution Making the Difficult Simple
, and high r
High speed, high sensitivity, and high resolution SDD detector and optimized hardware achieve the highest The Py-Screener system is designed to screen for phthalate esters in polymers.
High speed, high sensitivity
esolution SDD detector and optimized har
dwar
e achieve the highest
level of analysis performance in its series. The use of phthalate esters in toys and food packaging is currently restricted.
• Accommodates Various Types and Sizes of Samples Moving forward, they are expected to be regulated as restricted substances under
EDX-7000/8000/8100: the RoHS (II) Directive.
The combination of Small Spot Analysis Kit and EDXIR-Analysis Software facilitate the contaminant analysis. The Py-Screener system consists of special software, special standard samples, and
The combination of Small Spot Analysis Kit and EDXIR-Analysis Software facilitate the contaminant analysis.
Turret for 12 samples permits continuous measurement. a sampling toolkit, which supports the entire process from sample preparation to
EDX-7000/8100: data acquisition, data analysis, and maintenance. It provides an environment in
Vacuum Measurement Unit (also accommodates EDX-8000) and Helium Purge Unit enable the analysis of
Vacuum Measurement Unit (also accommodates EDX-8000) and Helium Purge Unit enable the analysis of which operations are simple, even for novices.
liquid, powder and solid samples.
EDX-8000/8100:
The wide-range detector permits the range of detected elements from C to U.
• Easy Operation
estricted material analysis and r
ective r
eport
PCEDX-Navi software allows easy operation for RoHS directive restricted material analysis and report
e allows easy operation for RoHS dir
PCEDX-Navi softwar
creation even for beginners.
Feature
High Sensitivity − Lower Limit of Detection Improved 1.5 to 5 Times! − Organics Solvents Are Not Required for Sample Preparation
The high-performance SDD detector and combination of optimized optics and primary filters achieve previously unheard-of high Analytical standards and test samples can be prepared without using organic solvents. To prepare a sample, just use the cutter to
levels of sensitivity. The sensitivity is higher than the previous Si (Li) semiconductor detector across the entire range from light to remove a portion from the test material, place it in the sample cup, and weigh it. Sample preparation videos provide support so that
heavy elements. even novices can easily prepare samples.
Lower limit of detection [ppm]
EDX-7000 EDX-7000/8000/8100
Previous model Previous model
10000.0
1000.0
100.0
10.0
1.0
Preparation of a Phthalate Ester Standard Preparation of a Test Sample
0.1
10 15 20 25 30 35 40 45 50 55 60 65 70 75 80 85 90 10.0 11.0 12.0 13.0 Sample Preparation Videos
Atomic number
Comparison of the Lower Limit of Detection in a Light Element Matrix Profile Comparison for Lead (Pb) in Copper Alloy Sample preparation videos: http://www.shimadzu.com/an/gcms/py-screener.html

Ultra-Light Element Analysis by EDX-8000/8100 Easy to Operate Using Special Software
The EDX-8000/8100 features an SDD detector with a special ultra-thin-film window material that is able to detect ultra-light The special software leads you through the required
elements such as carbon (C), oxygen (O), and fluorine (F) procedures, so even novices can perform the operations in
accordance with the software instructions. The Py and
GC-MS analysis conditions are preset. To automatically
LiF start continuous analyses, just place the prepared standard
CF2 samples and test samples in the autosampler, and enter
CaF2 the number of samples, the sample names, and their
weights. Continuous measurements can be performed Measurement Schedule Window
overnight, so approximately 30 samples can be measured
per day.

Special Py-Screener Software

Profile of Fluorine (F) by EDX-8000

EDX-LE
12 Energy Dispersive X-ray Fluorescence Spectrometer 13