Page 9 - EDX-7200

Vacuum Measurement Unit and Helium Purge Unit (Option)
Sensitivity for light elements can be increased by removing atmosphere. Two options are available: a vacuum measurement unit and a helium
purge unit.
The helium purge unit is effective when measuring liquid samples and samples that generate a gas and cannot be measured in a vacuum.

100
Cr Br Zr Cd vacuum
Ti Fe Zn air
80 Ca He
Relative intensity (%) 60 Cl K air
40

20
Al S
Mg P
0 Si
5 Na 15 25 35 45
Atomic No.
Relative Sensitivity of Measurements with Helium Purging and in Air Pro le Comparison in Vacuum and Air
(sensitivity in vacuum = 100) (sample: soda-lime glass)

Helium Replacement Measurement Unit (Option)
Helium replacement is effective for the analysis of the elements
contained in a sample that cannot be placed in a vacuum atmosphere,
He S Ka
such as generating liquid or gas. Equipped with a highly efficient air
helium gas replacement system (Japanese patent No. 5962855), it
reduces measurement time and helium gas consumption.

Pro le Comparison in Air and Helium After Purging
(EDX-7200 / sample: sulfur in oil)

12-Sample Turret (Option)
The addition of the turret allows automated continuous
measurements. It improves throughput, especially for measurements
in a vacuum or helium atmosphere.

EDX-7200
Energy Dispersive X-Ray Fluorescence Spectrometer 9