Page 5 - Shimadzu AIM-9000
P. 5

Automatic  Automatic
                                                                                        Contaminant  Qualitative
                                                                                        Recognition  Analysis
                                                                               Wide-Field                      High
                                                                                Camera   Finally, a wide view   Sensitivity
                                                                                         on micro sample analysis
 A Series of Smooth Micro Analysis
                                                                                  Contaminant             Micro
                                                                                    Analysis   Surface    Analysis
                                                                                               Analysis





                             Determine Where to Measure, and
 Load Sample
 Load           Measure
                             Measure Automatically


 Loading Samples Is Easy  Automatically Determine Measurement Positions   - Automatic Contaminant Recognition System -

 Pressing the [Eject Sample] button makes it easy to load and remove samples by automatically lowering the stage and switching   A function that automatically recognizes contaminants is   best model for their application. The automatically
 the objectives to expand space.  included standard. The analyst simply clicks one button and   determined measurement positions can either be measured
 Furthermore, the lower Condenser mirror can be removed to enable reflectance/ATR measurements of samples up to 40 mm   the software automatically recognizes the contaminant. It   without editing or the analyst can add or delete measurement
 thick.        even determines the optimal aperture size and angle   positions. Sample images are stored into the measured
               instantaneously.                              spectra automatically.
               Two modes are available: the standard mode and one   The sample and measurement positions can be easily
               optimized for extremely small areas. Users can choose the   identified later.


 Measures samples
  up to 40 mm thick






                                            Standard                 Micro
 Look for the Item to Be Measured
 Observe
               Analyze       Identify the Cause of Failures


 Quickly Determine the Measurement Position   - Wide-Field Camera* and Microscope Camera -
               Automatic Identification of Contaminants   - Contaminant Analysis Program -
 Shimadzu's proprietary wide-field camera and
 ×1
 microscope camera help observe samples efficiently. In   10 × 13 mm  The contaminant analysis program - the functionality for   The contaminant analysis program identifies measured
 addition to observing a large area up to 10 × 13 mm,   ×5  automatically qualifying contaminants - is included as a standard   contaminants with high precision using a spectral library for
 the wide-field camera also supports variable digital   2.0 × 2.6 mm  feature in LabSolutions  IR software. Measured spectra using   substances commonly detected as contaminants in combination
                             ™
 zooming. Furthermore, by sharing positional   AIMsolution can be loaded directly into LabSolutions IR and   with Shimadzu's proprietary identification algorithm (patent
 ×33
 information with the microscope camera, it achieves a   0.3 × 0.4 mm  analyzed.  pending).
 digital zoom function capable of zooming to a   ×330
 magnification of about 330× for observing areas as   Digital zoom
 30 × 40 µm    Contaminant Analysis Program Features
 small as 30 × 40 µm. (The microscope camera supports
 variable digital zoom magnifications up to 10×.)
                        It includes spectra for over 550 inorganic
 * The wide-field camera (P/N 206-32606-41) is optional.  substances, organic substances, and polymers   Searching for spectra, determining matches,
                                                                      and preparing reports are all automated.
                        commonly detected in contaminant analysis.
                                                                      Even for contaminants that are mixtures, it
                        It not only searches for spectra, but it also
                                                                      searches for primary and secondary
                        applies a special algorithm focused on spectral   components and also displays the probability
                        characteristics.
 Golden contamination adherent on metal plate                         of candidate substances.




 4                                                                                                                 5
   1   2   3   4   5   6   7   8   9   10