Page 4 - Shimadzu AIM-9000
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Automatic  Automatic
                                                                                                                                                                                                                  Contaminant  Qualitative
                                                                                                                                                                                                                  Recognition  Analysis
                                                                                                                                                                                                         Wide-Field                      High
                                                                                                                                                                                                          Camera   Finally, a wide view   Sensitivity
                                                                                                                                                                                                                   on micro sample analysis
                     A Series of Smooth Micro Analysis
                                                                                                                                                                                                            Contaminant             Micro
                                                                                                                                                                                                              Analysis   Surface    Analysis
                                                                                                                                                                                                                         Analysis





                                                                                                                                                      Determine Where to Measure, and
                                   Load Sample
                      Load                                                                                                               Measure
                                                                                                                                                      Measure Automatically


                     Loading Samples Is Easy                                                                                            Automatically Determine Measurement Positions   - Automatic Contaminant Recognition System -

                     Pressing the [Eject Sample] button makes it easy to load and remove samples by automatically lowering the stage and switching   A function that automatically recognizes contaminants is   best model for their application. The automatically
                     the objectives to expand space.                                                                                    included standard. The analyst simply clicks one button and   determined measurement positions can either be measured
                     Furthermore, the lower Condenser mirror can be removed to enable reflectance/ATR measurements of samples up to 40 mm   the software automatically recognizes the contaminant. It   without editing or the analyst can add or delete measurement
                     thick.                                                                                                             even determines the optimal aperture size and angle   positions. Sample images are stored into the measured
                                                                                                                                        instantaneously.                              spectra automatically.
                                                                                                                                        Two modes are available: the standard mode and one   The sample and measurement positions can be easily
                                                                                                                                        optimized for extremely small areas. Users can choose the   identified later.


                                                                          Measures samples
                                                                           up to 40 mm thick






                                                                                                                                                                      Standard                 Micro
                                   Look for the Item to Be Measured
                      Observe
                                                                                                                                         Analyze      Identify the Cause of Failures


                     Quickly Determine the Measurement Position   - Wide-Field Camera* and Microscope Camera -
                                                                                                                                        Automatic Identification of Contaminants   - Contaminant Analysis Program -
                     Shimadzu's proprietary wide-field camera and
                                                                        ×1
                     microscope camera help observe samples efficiently. In   10 × 13 mm                                                The contaminant analysis program - the functionality for   The contaminant analysis program identifies measured
                     addition to observing a large area up to 10 × 13 mm,       ×5                                                      automatically qualifying contaminants - is included as a standard   contaminants with high precision using a spectral library for
                     the wide-field camera also supports variable digital       2.0 × 2.6 mm                                            feature in LabSolutions  IR software. Measured spectra using   substances commonly detected as contaminants in combination
                                                                                                                                                       ™
                     zooming. Furthermore, by sharing positional                                                                        AIMsolution can be loaded directly into LabSolutions IR and   with Shimadzu's proprietary identification algorithm (patent
                                                                                             ×33
                     information with the microscope camera, it achieves a                   0.3 × 0.4 mm                               analyzed.                                     pending).
                     digital zoom function capable of zooming to a                                     ×330
                     magnification of about 330× for observing areas as                                Digital zoom
                                                                                                       30 × 40 µm                       Contaminant Analysis Program Features
                     small as 30 × 40 µm. (The microscope camera supports
                     variable digital zoom magnifications up to 10×.)
                                                                                                                                                  It includes spectra for over 550 inorganic
                     * The wide-field camera (P/N 206-32606-41) is optional.                                                                      substances, organic substances, and polymers   Searching for spectra, determining matches,
                                                                                                                                                                                                and preparing reports are all automated.
                                                                                                                                                  commonly detected in contaminant analysis.
                                                                                                                                                                                                Even for contaminants that are mixtures, it
                                                                                                                                                  It not only searches for spectra, but it also
                                                                                                                                                                                                searches for primary and secondary
                                                                                                                                                  applies a special algorithm focused on spectral   components and also displays the probability
                                                                                                                                                  characteristics.
                                                                    Golden contamination adherent on metal plate                                                                                of candidate substances.




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