Page 3 - Electric&Electronics - Total Solution for Analyzing Electronic Devices

Comprehensive Quantitation Functions

Shimadzu Analytical and Measuring

Instruments Used in Electrical/Electronic Fields

Electronic devices and semiconductor technologies support a variety of industries and add comfort to our lives.
Shimadzu develops and manufactures a wide range of instruments to help manufacturers conduct quality control of electronic
devices and comply with regulations and directives.
This catalog introduces equipment and related applications, such as observation of minute parts, elemental analysis,
evaluation of optical properties, measurement of hazardous substances, and evaluation of mechanical properties.

Evaluation Parameters, Measurement Instruments,
and Application Examples for Electrical/Electronic Products

Testing/Evaluation Testing/Evaluation Instrument Application Examples Testing/Evaluation Testing/Evaluation Instrument Application Examples
Parameter Parameter (Details) Parameter Parameter (Details)

Submicron contaminant analysis Evaluation and
Micro-area observation Electron probe microanalyzer Evaluation of characterization of Evaluation of thermal degradation and thermal resistance
and elemental analysis (EPMA) Elemental analysis of intermetallic compounds, Properties thermal degradation Thermal analyzer Characterization of liquid crystal materials
such as solder joints for mounted devices
and thermal resistance
Elemental analysis and X-ray photoelectron Composition/bond state analysis of a sample's surface and Evaluation of
chemical state analysis spectrometer (XPS) metal surface discoloration analysis Particle Size Measurement of Dynamic image analyzer (DIA) Evaluation of silica shape and coarse particle content in
electronic component sealing materials
coarse particles
Distribution
3D measurement and physical property
Scanning probe microscope (SPM) measurement of nano-regions Measurement of
Micro-area observation and atomic force microscope (AFM) emission gases Headspace gas chromatograph Measurement of gases emitted from components
Observation and Observation of micro-shapes on sample surfaces, Measurement of mass spectrometer (GCMS) Measurement of clean room atmospheres
LCD panel alignment lms, or ITO membranes
Analysis / Evaluation air pollutants
Observation of joints on mounted circuit boards Measurement of Trap headspace gas chromatograph
Non-destructive (BGA joints, etc.) Environmental emission gases mass spectrometer (GCMS) Analysis of gases emitted from components
observation of X-ray uoroscopy and CT system Observation of internal structures in electrical/electronic Measurement
interior structures components and failure analysis
Non-destructive 3D measurement of plastic Measurement of Atomic absorption (AA) Measurement of trace metals in rinse water
connectors and other molded parts trace impurities spectrophotometer
Elemental analysis Identi cation of organic compounds and analysis of Analysis and management Management of ultrapure water, recovered water, ef uents,
and contaminant Infrared microscope contaminants on electronic components of water Total organic carbon (TOC) and plating solutions
analysis analyzer
Quantitative measurement of phosphorus and boron Evaluation of strength Precision universal testing machine Various strength evaluations of electronic components,
in silicon wafers Compact tabletop testing machine circuit boards, etc. (peeling test, shearing test, etc.)
Evaluation of lm Fourier transform infrared (FTIR)
thickness spectrophotometer Measurement of lubricant oil lm thickness on
Evaluation of hard drive discs Magnetic micro force Evaluation of endurance of electronic components,
Measurement of epitaxial lm thickness on semiconductors
Optical Evaluation of endurance testing machine circuit boards, etc. (cyclic bending test, etc.)
Properties
Measurement of Ultraviolet-visible-near infrared Measurement of antire ection coating re ectance
re ectance and (UV-VIS-NIR) spectrophotometer Transmittance measurement of smartphone proximity Evaluation of Micro compression Evaluation of strength of liquid crystal spacers and
transmittance sensor window Mechanical Evaluation of strength testing machine conductive particles
Properties
Energy dispersive X-ray Screening for elements regulated by RoHS/ELV Directives
uorescence Analysis of elements in layer structure and elemental Evaluation of surface Dynamic ultra micro Evaluation of lm thickness, surface treatment layer,
spectrometer (EDX) analysis of contaminants hardness hardness tester and microelectronic components

Measurement of viscosity of sealing epoxy resins for
Pyrolysis gas chromatograph Analysis of phthalate esters and brominated ame Measurement of viscosity Flowtester (capillary rheometer) printed circuit boards and ICs
Evaluation of mass spectrometer (Py-GC/MS) retardants speci ed in the RoHS Directive
Additives and Measurement of
Hazardous hazardous substances Measurement of weight Balance Con rmation of electronic circuit board weight
Substances ICP emission spectrometer and Accurate quantitative analysis of substances regulated Evaluation of Mass during manufacturing and measurement of
ICP mass spectrometer by RoHS/ELV Directives semiconductor microcomponent weight

Evaluation of halogen-free state in electrical /
Ion chromatograph electronic materials
Measurement of sulfur components in chemical materials

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