Page 13 - Shimadzu Journal vol.10 Issue1
P. 13

Understanding and trusting relationships based on the idea of contributing to each other         INSIGHT from CUSTOMER

           Mr. Keiji Sumiya











                                Microfocus X-Ray CT System
                                inspeXio SMX-225CT FPD HR Plus

                                Ultimate Image Quality and
                                Advanced Operability

                                High Resolution CT Image
                                •  Maximum 14 Megapixel Input Resolution and Ultra
                                High-Resolution Reconstruction
                                High Contrast CT Image
                                •  High-Contrast Detector with a Wide Dynamic Range,
                                and an Improved X-Ray Generator
                                Easy and Fast CT Scan
                                •  New Fully-Automatic CT Function & an Advanced
                                High-Performance Computing System
                                               Learn more








                                Scanning Probe Microscope/Atomic Force Microscope
                                SPM-Nanoa


                                High-Resolution Scanning Probe
                                Microscopes

                                Automatic Observation
                                •  Adjusts laser beam and, parameter settings during observation,
                                and performs image processing automatical.
                                Extensive Functionality
                                •  Captures sharp images with optical microscopy to SPM
                                microscopy modes
                                Various Support Functionality Achieves Fast Observation
                                •  High-throughput observation and fast physical property mapping
                                               Learn more











                                        Keiji Sumiya is General Manager of Materi-  support analysis of all R&D divisions of the company. The Materials
                                      als Analysis, Advanced Technology Research   Analysis Division takes a pivotal role in developing the functional ma-
                                      and Development Center, Innovation Promo-  terials products in Showa Denko Materials’ diverse group.
                                      tion Headquarters, Showa Denko Materials
                                      Co., Ltd. Since joining the company, he has
                                      been engaged in research and development
                                      of functional materials (about 17 years) and   Showa Denko K.K. (SDK) (Tokyo: 4004) announces its
                                      material function analysis (about 18 years).   integration with Showa Denko Materials Co., Ltd.
                                      The products involved include semiconduc-  (SDMC) effective on January 1, 2023 to establish “Resonac”.
                       tor die-bond materials, radiation detection elements (scintillators)
                       for cancer detection PET, and negative electrode materials for Li-ion   More information:
                       batteries for EVs. Since 2013, as the head of the Materials Analysis Di-  Showa Denko Press release
                       vision, he has vigorously promoted business contributions through



                                                                                                Shimadzu Journal  vol.10  Issue1 12
   8   9   10   11   12   13   14   15   16   17   18