Page 7 - Shimadzu Xslicer SMX-1010

Simple Operation

Simple UI and Easy Positioning Operations Example of Continuous Inspections Using the Step Feed Function

A large monitor screen and simple button layout provide excellent visibility for intuitive operability. X-ray inspections can be Inspection times were compared for consecutive X-ray inspections of 25 samples using the step feed function on the previous
performed easily, even by operators using the system for the first time. SMX-1000 Plus and the SMX-1020. Inspection times are approximately 40 % shorter in comparison to the SMX-1000 Plus.
Additionally, X-ray emission times are reduced by at least 35 %, which also reduces running costs. The time reduction ratio
increases as the number of samples increases.
1 Stage Positioning via the Live X-ray Image
Simply click on any point in an X-ray image to control all stage movements, such as changing the XY
position, tilt, or field-of-view size. Item SMX-1000 Plus Xslicer SMX-1020

Exterior Image Acquisition 00:22 00:04

Movement to the Start Position 00:12 00:04

25-Sample Step Feed 03:28 02:17

Movement to the Sample
Replacement Position 00:09 00:07

Total 04:11 02:32

Approx. 40 % less time

Samples arranged at fixed intervals can
be observed consecutively. The starting
position, movement amount, and number
of movements can be specified. During
implementation, consecutive movements
and observations are made in accordance
3
2 Using Exterior Images for Stage Positioning Positioning with a Mouse
with the settings from the start position.
An observation camera provides a top-down view of the entire An observation camera provides a top-down view of the entire After the inspection, a table of the pass/
sample region. The user can alter the position of the sample using sample region. The user can alter the position of the sample using fail/hold results can be displayed.
this top-down view. Just select a point of interest in the top-down this top-down view. Just select a point of interest in the top-down
view to accordingly move the stage. The image can be magnified view to accordingly move the stage. The image can be magnified Observation Direction: Horizontal Observation Direction: Vertical
to allow for fine positioning over individual components. to allow for fine positioning over individual components.

Inspections with the Xslicer SMX-1020 Take Half the Time of the
Faster Detector Acquisition and Stage Movements Xslicer SMX-1010

The flat panel detector acquisition is 4× faster than the previous model, and the stage movement (XY direction) is 1.6× faster. In The Xslicer SMX-1020 can inspect twice the horizontal area of the SMX-1010. The area in a single inspection is twice the size, so the
addition to ordinary use, this contributes to faster tact times during consecutive inspections. inspection takes about 1/2 the time. The time can be shortened even more in consecutive inspections of samples arranged on a pallet.
Acquisition Speed: 62.5 ms/frame
A c q u i s i ti on S p e e d: 62 . 5 m s / f r am e
FPD Acquisition Speed 4× FPD
Stage with Sample

a
x
i
X-axis: 90 mm/sec c Xslicer SMX-1010
X
-
s
/
s
e
: 9
0 m
m
imaging area
Stage Movement Speed 1.6×
Y-axis: 90 mm/sec
Y-axis: 90 mm/sec
Xslicer SMX-1020
imaging area
Xslicer SMX-1010/1020
6 Microfocus X-Ray Inspection System 7