Page 9 - Shimadzu LabSolutions IR

Contaminant analysis program

By combining Shimadzu’s own algorithms (patent pending) with that of library spectra for common contaminants, this
program identifies contaminants with a high degree of accuracy. Reports are automatically created after analysis, thereby
reducing post-processing time to a few seconds.
With automated reporting, this easy-to-use program allows operators with little FTIR knowledge to perform analysis easily.

4 features of the Contaminant analysis program

Contains spectra for over 550 highly-selected
inorganic substances, organic substances, Allows automation of the process, including searching,
and polymers that are often detected as contaminants in judgment evaluation, and report creation.
Shimadzu’s Analytical Applications Department.

Incorporates algorithms that focus on spectral characteristics, Major and Minor components are found and
rather than performing simple spectrum searches. their ranks are displayed.

0.200
Abs
0.175
0.150
0.125
0.100
IRAffinity-1S+MIRacle10 0.075
0.050
0.025
0.000
4000 3600 3200 2800 2400 2000 1800 1600 1400 1200 1000 800 600
Contaminant 1/cm
Contaminant caused during manufacturing an electronic parts
ele
Cont aminant c a u s e d dur i n g manuf ac t u r i n g an n ele c c t r o n ic par t s
Contaminant caused during manufactur
ring
Sample: Sample: Contaminant caused during manufacturing
(appr
i
lt
onic
1
ø
(
ox
an
an electronic (approx. 1mmø)
an electronic (approx. 1mmø)1mmø) )
electr
y
ory: Single reflectance HATR
g
IRTracer-100+AIM-8800 Accessory: Single reflectance HATR
MIRacle10 with ZnSe prism
nSe prism
MIRacle10 with Z

LabSolutions IR
Analytical Data System for FTIR 9