Page 8 - Shimadzu EDX-8100

Extremely Flexible

Accommodates all types of samples from small to large, from powders to liquids. Options include a vacuum measurement unit and
helium purge unit for highly sensitive measurement of light elements and a 12-sample turret for automated continuous measurements.

Sample Observation Camera and Collimators Optional Vacuum Measurement Unit and Helium Purge Unit
Automatic collimator switching in four stages: 1, 3, 5, and 10 mm diameter Sensitivity for light elements can be increased by removing atmosphere. Two options are available: a vacuum measurement unit and a helium
Select the irradiation chamber from four values to suit the sample purge unit.
size. The helium purge unit is effective when measuring liquid samples and samples that generate a gas and cannot be measured in a vacuum.
Select the most appropriate irradiation diameter for the sample
shape: 1 mm diameter for trace foreign matter analysis or defect 100 Cr Zn Br Zr Cd vacuum
analysis; 3 mm or 5 mm diameter for small sample volumes. 80 Ti Ca Fe He air

Sample observation camera included standard Relative intensity (%) 60 K air X-ray intensity
Use the sample observation camera to confirm the X-ray irradiation 40 Cl
position on a specific position to measure small samples, samples 20
1 mm dia. Collimator Selected 5 mm dia. Collimator Selected, Al S
™
comprising multiple areas, or when using a Micro X-Cell . Using Micro X-Cell Mg P
0 F Si
5 Na 15 25 35 45
Atomic No.
Relative Sensitivity of Measurements with Helium Purging and in Air Pro le Comparison in Vacuum and Air
(sensitivity in vacuum = 100) (sample: soda-lime glass)
Automatic Replacement of Five Primary Filters
Advanced Helium Purge Unit (Option)
Primary filters enhance detection sensitivity by reducing the Filter Effective Energy ʢkeVʣ Target Elements (Examples)
continuous X-rays and the characteristic X-rays from the X-ray tube. #1 15 to 24 Zr, Mo, Ru, Rh, Cd This proprietary system (Japanese Patent No. 5962855) efficiently purges the instrument with helium gas to achieve an approximately
They are useful for the analysis of trace elements. #2 2 to 5 Cl, Cr 40 % reduction in purge time and helium gas consumption compared to previous units.
The EDX-8100 incorporates five primary filters as standard (six, #3 5 to 7 Cr (Option for EDX- 8100)
#4 5 to 13 Hg, Pb, Br
including the open position), which can be automatically changed
#5 21 to 24ʢ5 to 13ʣ* Cd (Hg, Pb, Br)
using the software.
* This lter also cuts the background in the energy range shown in parentheses ( ).
He
air F Ka
X-ray intensity
RhL line RhK line

Background from
continuous X-rays

Filter. #2 Filter. #4 Filter. #1
Pro le Comparison in Air and Helium After Purging
(EDX-8100 / sample: uorine in uorine coating agent)

12-Sample Turret (Option)
The addition of the turret allows automated continuous
measurements. It improves throughput, especially for
Sample : Cl-containing PE resin Sample : Hg/Pb-containing PE resin Sample : Rh/Cd-containing aqueous solution
measurements in a vacuum or helium atmosphere.
Effect of the Primary Filters
Freely Combine Collimators and Primary Filters
The collimators and primary filters are driven independently and can be combined to address specific requirements. Select the optimal
With the turret guide removed,
combination from 24 (6 filters x 4 collimators) available options.
samples varying in size can be
Quantitative analysis using the FP method is possible with all combinations. added.

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