Page 7 - Shimadzu EDX-8100

Unrivaled Analytical Performance

The high-performance SDD detector and optimized hardware achieve a high level of sensitivity, analysis speed, and energy resolution
that were previously unattainable. It supports light element analysis of 6C to, and can be used in conjunction with the helium substitution
option to analyze liquid samples containing light elements (F to Al) as is.
High Resolution
High Sensitivityɹ− Lower Limit of Detection Improved 1.5 to 5 Times! − The EDX-7000/8000/8100 instruments achieve superior energy EDX-8100 Previous model
resolution compared to previous models by incorporating a (EDX-720)
High performance Silicon Drift Detector (SDD) for helium substitution and combination of optimized optics and primary filters achieve
state-of-the-art SDD.
previously unheard-of high levels of sensitivity. The sensitivity is higher than the previous Si (Li) semiconductor detector across the entire range
This reduces the effects of overlapping peaks of different
from light to heavy elements.
elements, enhancing the reliability of the analysis results.
Lower limit of detection [ppm]
EDX-8100
EDX-8100
10000 Previous model (EDX-720)
Previous model (EDX-720) Comparison of Energy Resolutions (sample: PPS resin)
No Liquid Nitrogen Required
1000
The SDD detector is electronically cooled, eliminating the need for cooling by liquid nitrogen. This frees the user from the chore of replenishing
100
the liquid nitrogen and contributes to lower running costs.
10

Range of Detected Elements
1
1 18
0.1
5 10 15 20 25 30 35 40 45 50 55 60 65 70 75 80 85 10.0 11.0 12.0 13.0 1 EDX-8100: 6C to 92U 2
Atomic number 1 H He
Comparison of detection limits for aqueous solutions Profile Comparison for Lead (Pb) in Copper Alloy 2 13 14 15 16 17
3 4 5 6 7 8 9 10
2 Li Be Guideline of Lower Detection Limits in a Light Element Matrix B C N O F Ne
0.1ppmʙ 1ppmʙ 10ppmʙ 100ppmʙ 0.5%ʙ 10%ʙ
11 12 13 14 15 16 17 18
3 Na Mg Al Si P S Cl Ar
High Speedɹ− Throughput Increased by up to a Factor of 10 − 4 19 Ca Sc Ti V Cr Mn Fe Co Ni Cu Zn Ga Ge As Se Br Kr
21
20
27
26
23
22
25
24
31
30
36
32
35
28
29
33
34
K
The high fluorescent X-ray count per unit time (high count rate) of the SDD detector permits highly precise analysis in a shorter measurement time.
37 38 39 40 41 42 43 44 45 46 47 48 49 50 51 52 53 54
This feature is achieved to the maximum when analyzing samples that generate a lot of fluorescent X-rays, such as samples with a metal as the 5 Rb Sr Y Zr Nb Mo Tc Ru Rh Pd Ag Cd In Sn Sb Te I Xe
Main component element.
55 56 57-71 72 73 74 75 76 77 78 79 80 81 82 83 84 85 86
6 Cs Ba Hf Ta W Re Os Ir Pt Au Hg Tl Pb Bi Po At Rn
Standard *
deviation Comparison Using Actual Samples 87 88 89-103 104 105 106 107 108 109 110 111 112 113 114 115 116 117 118
7 Fr Ra ** Rf Db Sg Bh Hs Mt Ds Rg Cn Nh Fl Mc Lv Ts Og
EDX-8100
Previous model (EDX-720) Repeatability using the EDX-8100 and the
previous model (EDX-720) were compared for 57 58 59 60 61 62 63 64 65 66 67 68 69 70 71
6 La Ce Pr Nd Pm Sm Eu Gd Tb Dy Ho Er Tm Yb Lu
lead (Pb) in lead-free solder. *
89 90 91 92 93 94 95 96 97 98 99 100 101 102 103
Sample External Appearance
7 Ac Th Pa U Np Pu Am Cm Bk Cf Es Fm Md No Lr
**
ɾ An optional vacuum measurement unit or helium purge unit is required to measure light elements (15P and below) with the EDX-8100.
ɾ Lower detection limit vary depending on the sample matrix or coexisting elements.
ɾ Lower detection limit of light element (20Ca and below) get worse when the sample cell film is used.
Measurement time Previous model (EDX-720) ɾ It is impossible to measure 8O and below with sample cell film.
Relationship Between Measurement Time and
Standard Deviation (Variance in Quantitation Values)
Ultra-Light Element Analysis by EDX-8100 LiF
Extending the Measurement time to increase the fluorescent The EDX-8100 features an SDD detector with a special ultra-thin-film window CF2
X-ray count can improve the precision (repeatability) of X-ray EDX-8100 Approx. 1/10 measurement time CaF2
material that is able to detect ultra-light elements such as carbon (C), oxygen (O),
fluorescence spectrometry.
and fluorine (F)
The EDX-8100 incorporates a high-count-rate SDD that
Measurement time
achieves highly precise analysis of the target in a shorter Measurement time Required to Reach the Target Analysis Precision
Measurement time than the previous model (EDX-720).
Profile of Fluorine (F) by EDX-8100
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