Page 7 - GCMS-QP2050

Simple Operation, Confident Results

Easy Maintenance

Ion Source Maintenance Takes Just One Minute Anyone Can Achieve Analysis Results

With the DuraEase ion source, the conventional ion source structure has been completely revised, in pursuit of more
convenient maintenance. The ion source is disposable and no cleaning is required, so maintenance is finished in just Examination of the analytical conditions is indispensable for acquiring better data. The GCMS-QP2050 reduces the
burden of examining these conditions, allowing even novice users to acquire data on par with an experienced operator.
one minute.

1.4e4 Q 159.00 1.39e4 Q 277.00 4.23e3
Replacement time of 4.0e3
Easily Analyze a Wide Range 1.2e4 3.2e3
1.0e4
of Applications 8.0e3 2.4e3
6.0e3
1.6e3
4.0e3
Separation With the completely new ion source and detector, 8.0e2
2.0e3
the system is more than capable of detecting even 0.0e0 RT (min) 0.0e0 RT (min)
9.00 9.20 9.40 9.60 9.80 12.15 12.25 12.35 12.45 12.55 12.65 12.75
trace compounds. Cadusafos (3 pg/µL) Fenitrothion (3 pg/µL)
Attach and rotate the special jig. Remove the two parts. Replacement of the ion source box The new interface, which minimizes the production of cold spots, enables the acquisition of favorable peak shapes and
sensitivity, even for compounds prone to adsorption.
(x1,000,000) (x1,000,000)
1.00 1.50
Uniform
Heater 0.75 1.25
temperature 1.00
distribution
One-Touch GC Inlet 0.50 0.75
0.50
Maintenance 0.25 0.25
The instrument is equipped as MS GC 23.5 24.0 24.5 25.0 23.5 24.0 24.5 25.0
General Instrument GCMS-QP2050
standard with a ClickTek nut,
™
New Interface Example of the Analysis of Tetracontane
enabling the GC injection port to be
attached or detached simply by
manipulating a lever by hand,
Ultra Fast Scanning Technology Supports Accurate Measurements
without tools.
Advances to Shimadzu’s impressive high-speed scan technology result in the industry's highest level of 30,000 u/sec. As a
result, sensitivity on par with SIM analysis can be obtained even with FASST* . In addition, Advanced Scanning Speed Protocol
1
Easy Startup and Shutdown
™ 2
(ASSP * ) minimizes sensitivity loss, even when the Scan measurement range is widened, enabling accurate qualitative analysis.
from the Touch Panel
*1 Fast Automated Scan/SIM Type: In this measurement mode, switching rapidly between Scan mode and SIM mode enables high-sensitivity SIM analysis and Scan
The vacuum system can be turned analysis for component confirmation to be performed simultaneously in a single analysis.
*2 By automatically optimizing the rod bias voltage during high-speed scans, this control technology minimizes sensitivity drops during high-speed scans.
ON/OFF and Easy sTop* can be
performed from the GC touch panel. Inten. Inten.
100 100
Operations from a personal computer 317 1,000 u/sec 317 30,000 u/sec
are not required, so maintenance of 75 236 75 236
the GC injection port, column, and 50 50
173 287 173 287
ion source can proceed with ease. 76 196
25 76 196 207 25 92 207
* This function guides the user through the 92 109 137 167 240 291 108 136 147 169 240 291
replacement of the GC injection port septum 0 0
100 150 200 250 300 350 m/z 100 150 200 250 300 350 m/z
and glass insert without turning OFF the
vacuum system. Mass spectra of Chlornitrofen

6 7