Page 36 - Shimadzu Journal vol.10 Issue1
P. 36

RELEASED



          New Products








            IR-Xross                                             XSeeker 8000
            Fourier Transform Infrared Spectrophotometer         Microfocus X-Ray CT System

                                                                This product is equipped with a
            The IRXross offers the high perfor-                 high-output X-ray generator and
            mance and easy operation that                       a high-resolution flat panel de-
            meets the demands of the phar-                      tector. Despite its compact size, it
            maceutical and chemical indus-                      has a high X-ray output of 160 kV,
            tries. IRXross provides an S/N ratio                enabling clear observations of
            of 55,000:1, the highest in its class.              molded plastic parts as well as
            It is also compliant with data in-                  aluminum die cast parts and
            tegrity regulations required in the                 other metal parts. In addition, the
            pharmaceutical field. The IRXross                   newly developed XSeeker control
            offers the optimal solution for a                   software provides high operabil-
            new era with diverse application                    ity and the highest throughput to
            requirements.                                       date.and quality evaluation to in-
                                                                spections at machining sites.

                             Learn more                                           Learn more



            AA-7800                                              MIV-X
            Atomic Absorption Spectrophotometer                  MAIVIS Ultrasonic Optical Flaw Detector



            The Shimadzu Atomic Absorption                      Ultrasonic optical flaw detection
            Spectrophotometer AA -7800                          enables the visualization of inter-
            Series is versatile enough for a                    nal flaws (at a depth of about 1
            variety of analytical applications                  mm) that are hard to find using
            (Any Application), safe and easy to                 conventional ultrasonic testing.
            use even for beginners (Any User),                  The MIV-X visualizes and digitizes
            and offers continuous analysis                      flaws (peeling, cracks, and voids)
            using autosamplers and remote                       in parts and multi-materials in air-
            data analysis via network connec-                   craft, automobiles, and electrical
            tions to increase the flexibility of                and electronic equipment.
            the analysis operator’s work style
            (Any Location).



                             Learn more                                           Learn more



            TRAPEZIUM SATELLITE                                  LCMS-9050
            Testing Machine Remote Monitoring System             Quadrupole Time-of-Flight Liquid Chromatograph
                                                                 Mass Spectromet

            TRAPEZIUM SATELLITE is a remote                     The LCMS-9050 is a quadrupole
            monitoring system for testing                       Time-of-Flight (Q-TOF) mass spec-
            machines. It consists of a monitor-                 trometer system with the highest
            ing device, a USB camera, and                       mass accuracy stability levels avail-
            software for remotely monitoring                    able. The stable positive/negative
            the operating status of fatigue                     high-speed polarity switching tech-
            testing machines using a web                        nology enables the simultaneous
            browser. The operating status of                    analysis of positive ions/negative
            equipment can be checked while                      ions, contributing to new applica-
            away from the laboratory, which                     tions development and heightened
            heightens the efficiency of testing                 analysis efficiency.
            work and reduces workloads.



                             Learn more                                           Learn more



                                                                                                Shimadzu Journal  vol.10  Issue1 35
   31   32   33   34   35   36   37