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Contaminant Analysis Program

            By combining Shimadzu’s own algorithms (patent pending)  with that of library spectra for common contaminants, this program
            identi es contaminants with a high degree of accuracy.  Reports are automatically created after analysis, thereby re ducing
            post-processing time to a few seconds.
            With automated re porting, this easy-to-use program allows operators with little FTIR knowledge to perform analysis easily .


                                    4 features of the Contaminant analysis program

                   Contains spectra for over 500 highly-selected
                    inorganic substances, organic substances,    Allows automation of the process, including searching,
              and polymers that are often detected as contaminants in   judgment evaluation, and report creation.
                  Shimadzu’s Analytical Applications Department.


             Incorporates algorithms that focus on spectral characteristics,  Major and Minor components are found and
                  rather than performing simple spectrum searches.           their ranks are displayed.






                                                                0.200
                                                                 Abs
                                                                0.175
                                                                0.150
                                                                0.125
                                                                0.100
                              IRAf nity-1S + MIRacle10          0.075
                                                                0.050
                                                                0.025
                                                                0.000
                                                                  4000 3600 3200 2800 2400 2000 1800 1600 1400 1200 1000  800  600
                                                                   Contaminant                       1/cm
                                                                                             ele
                                                                                               c
                                                                   Contaminant caused during manufacturing an electronic partss
                                                                   Contaminant   ca used   durin g  ma nufa ct urin g  an n    ele ct roni c  pa rt
                  IRAf nity-1S + AIM-8800                            Sample:   Contaminant caused during manufacturing ring
                                                                         Contaminant caused during manufactur
                                                                     Sample:
                                                                               ic
                                                                              onic
                                                                           elec
                                                                             t
                                                                                     1mmø
                                                                                     1mmø
                                                                                (
                                                                                (approx
                                                                         an
                                                                         an electronic (approx. 1mmø)
                                                                           electr
                                                                         an electronic (approx. 1mmø) ) )
                                                                       ory: Single re…ectance HATR
                                                                     Accessory: Single re…ectance HATR
                                                                           g
                                                                        y
                                                                         MIRacle10 with ZnSe prism
                                                                         MIRacle10 with Z nSe prism



                                                                                               IRAf nity-1S
                                                                                           Fourier Transform Infrared Spectrophotometer  13
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