Page 6 - Shimadzu UV-2600-2007i

Single monochromator UV-2600i

Scalability to near-infrared measurement

A key feature of the UV-2600i single monochromator system is its measurement wavelength range.
By using the optional ISR-2600Plus Integrating Sphere attachment, the measurement wavelength
range can be extended from 220 nm to 1400 nm, significantly expanding its applications.

Integrating Sphere Enables Wider Measurement Wavelength Range UV-2600i
Measurements to 1400 nm
UV-2600i
The UV-2600i is also equipped with Shimadzu’s proprietary
185 900 nm
Lo-Ray-Ligh grade diffraction grating, which achieves high
efficiency and low stray light levels. By installing the ISR-2600Plus
UV-2600i + ISR-2600Plus
two-detector integrating sphere, the 300 nm to 1100 nm
wavelength range of conventional models can be extended to 220 1400 nm
1400 nm. In addition, the UV-2600i achieves a significant noise
reduction, and can accommodate measurements of solar cell
anti-reflective films and polycrystalline silicon wafers.

Transmittance Measurements of Polycrystalline Silicon Using the ISR-2600Plus UV-2600i
50.0
Mirror M3 Mask
Ref. light
40.0
30.0 Mirror M2
T%
20.0 8°
90°
Mask
10.0
60 mm dia. Sample light
integrating sphere
0.0
500.0 600.0 800.0 1000.0 1200.0 1400.0 Mirror M1
nm
ISR-2600Plus Integrating Sphere Attachment
This is a transmittance measurement of polycrystalline silicon.
Since the system is capable of measurements to 1400 nm, the
transmission characteristics of the band gap region (near 1000 nm)
are clearly evident.

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