Page 13 - Shimadzu IRXross

Applications and Options

Electrical/Electronic Applications Polymer Applications
(Defect Analysis and Contaminant Analysis) (Tracking Reactions in Materials)

Microscopes are well suited to measuring micro-areas. Because they focus the Rapid scan measurements are useful for tracking reaction changes in UV
light, there is greater light loss than with regular measurements, but they curable resins. Optional Rapid Scan software can visually display time-course
can accurately identify tiny peaks from a high-sensitivity interferometer. changes in target peaks during each scan. As scan speeds increase, the
sensitivity of the standard DLATGS detector can decrease due to the detec-
tor’s frequency characteristics. However, an optional MCT kit can be installed
to enable high-sensitivity measurements even at high scan speeds.

AIM-9000 Infrared Microscope QATR 10
™
The AIM-9000 incorporates a bright, optimized optical system This single-reflection ATR attachment features a prism made of only
and a high-sensitivity MCT detector. In addition to enabling diamond to enable measurements up to 400 cm (wide range model).
-1
high-sensitivity measurement of micro samples, the system Spectra are measured from liquid samples by simply placing a droplet on
has been automated to ensure all steps involved in micro the prism. Other samples are measured by placing them on the prism and
analysis can be performed quickly and easily. clamping them against the prism surface. The angle of incidence is 45
degrees. Four types of prisms are available, including a Ge, ZnSe, and two
diamond prisms (wide range and high-throughput models). The Ge prism is
best suited for samples with a high refractive index.

ATR Objective MIRacle 10
™
This objective lens is used when performing ATR measure- This is a single-reflection ATR accessory. To measure the spectrum of a
ments with the AIM-9000 infrared microscope. Using a liquid, simply place it on the surface of the prism drop-wise. Measure solid
cone-type prism, this single reflection objective features 15× samples by simply clamping them onto the surface of the prism using the
magnification and a 45-degree mean incident angle. The provided pressure clamp. In addition, the MIRacle-10 enables easy measure-
slide-on type prism makes it easy to switch back and forth ment of large samples (with a large surface area) without compromising
between visible observation and infrared measurement. sample integrity. The incidence angle is 45°. Select from three prism
options: ZnSe, Ge, and diamond/ZnSe, and whether the prism is equipped
with a pressure sensor. The Ge prism is ideal for samples with a high
refractive index.

Mapping Program
Rapid Scan
The mapping program measures the absorption distribution
on the surface of a sample and creates imaging data when The Rapid Scan option provides the capability of collecting and recording a
used with the Shimadzu AIM-9000 infrared microscope. It maximum of 20 spectra/second. This is especially suitable for fast reactions
allows setting of mapping parameters, such as the mapping kinetics, where reactions are completed in a few seconds. Spectra obtained
range, the scan intervals, and the background positions, on from Rapid Scan measurements can be used to calculate peak heights and
the composite visible images. areas, which are used to determine kinetic rates.

12 13