AXIS Supra+ — XPS Surface Analysis Instrument
Our next generation XPS, the AXIS Supra+, with enhanced performance over its predecessor, combines market leading spectroscopic and imaging capabilities with unrivalled automation to ensure high...
SPM-Nanoa — Scanning Probe Microscope/ Atomic Force Microscope
Automatic Observation
Adjusts Laser Beam, Adjusts Parameter Settings During Observation, and Performs Image Processing Automatically
Operating time when using standard samples and standard cantilever: about 5...
SPM-8100FM — High Resolution Scanning Probe Microscope
See the Nano World Come to Life
The new HR-SPM scanning probe microscope uses frequency detection.his instrument is not only capable of ultra-high resolution observations...
AXIS Supra — XPS Surface Analysis Instrument
The spectroscopic and imaging performance of an X-ray photoelectron spectrometer define its ability to perform in the most demanding research and development laboratories. The...
AXIS Nova — Surface Analysis Spectrometer
X-ray photoelectron spectroscopy (XPS), also known as electron spectroscopy for chemical analysis (ESCA), is a mature and widely used surface analysis technique for materials...
EPMA-8050G — Electron Probe Microanalyzer
Debut of the Grand EPMA With a Cutting-Edge FE Electron Optical System, the Ultimate in Advanced Shimadzu EPMA Analysis Performance
This instrument is equipped with...
EPMA-1720 HT — Electron Probe Microanalyzer
Revolutionary Fusion of Advanced Analytical Capabilities and Superb Operability Technology at the Pinnacle of Evolution Finally Arrives High Sensitivity, High Accuracy, High Resolution, and...
SPM-9700HT — Scanning Probe Microscope
Making the Unknown Visible Scanning probe microscope (SPM) is a generic term for microscopes that scan sample surfaces with an extremely sharp probe to...