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iSpect DIA-10 — Dynamic Particle Image Analysis System

Comprehensive Particle Characterization Shimadzu's iSpect DIA-10 Dynamic Image Analyzer combines particle size and image analysis technology to offer complete particle characterization. It can perform particle...

AIM-9000 — Infrared Microscope

System GC — Natural Gas Analysis System

Shimadzu Journal Vol.10 Issue1

Application -- Software

Application

OAD-TOF system — Quadrupole Time-of-Flight Mass Spectrometer system Equipped with Ion…

LCMS-TQ RX Series — Triple Quadrupole LC-MS/MS

ELEM-SPOT™ — Element Selective Gas Chromatograph Mass Spectrometer

MAP-100 — Microplastic automatic preparation device

EDX-LE Plus — Energy Dispersive X-Ray Fluorescence Spectrometer

AXIS Supra+ — XPS Surface Analysis Instrument

SPM-Nanoa — Scanning Probe Microscope/ Atomic Force Microscope

PDA-5000 — Optical Emission Spectrometer

AGX-V2 Series — Precision Universal Testing Machine

NJ-SERVO Series

EHF-E Series — Frame Type Fatigue Tester

SMV-301/301RT — Mooney Viscometer

XSeeker 8000 — Microfocus X-Ray CT System

Xctal 5000 — Phase-Contrast X-Ray CT System

Xslicer SMX-6010 — Microfocus X-Ray Inspection System

Xslicer SMX-1010/1020 — Microfocus X-Ray Inspection System

2023 Shimadzu Analytical and Measuring Instruments

General Brochure Testing and Inspection Machines

Material Testing Machines (Physical Measurement)

Material Characterizations

LCMS-TQ RX Series

OAD-TOF system

MUP-3100

Brevis GC-2050 Gas Chromatograph

Nexera XS inert